Literature DB >> 9306735

"Standardless" quantitative electron probe microanalysis with energy-dispersive X-ray spectrometry: is it worth the risk?

D E Newbury1, C R Swyt, R L Myklebust.   

Abstract

"Standardless" procedures for quantitative electron probe X-ray microanalysis attempt to eliminate the need for standardization through calculation of standard (pure element) intensities. Either "first principles" calculations, which account for all aspects of X-ray generation, propagation, and detection, or "fitted standards" calculations, which use mathematical fits to measured intensities from a limited set of pure standards, can form the basis for standardless analysis. The first principles standardless analysis procedure embedded in the National Institutes of Health/National Institute of Standards and Technology comprehensive X-ray calculation engine and database, Desktop Spectrum Analyzer, has been tested against spectra measured on NIST standard reference materials, research materials, and binary compounds. The resulting distribution of errors is broad, ranging from -90% to +150% relative. First principles standardless analysis can thus lead to unacceptably large errors.

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Year:  1995        PMID: 9306735     DOI: 10.1021/ac00107a017

Source DB:  PubMed          Journal:  Anal Chem        ISSN: 0003-2700            Impact factor:   6.986


  4 in total

1.  Genome-wide comparison deciphers lifestyle adaptation and glass biodeterioration property of Curvularia eragrostidis C52.

Authors:  Ngoc Tung Quach; Cao Cuong Ngo; Thu Hoai Nguyen; Phi Long Nguyen; Thi Hanh Nguyen Vu; Thi Hoai Trinh Phan; Quang Huy Nguyen; Thanh Thi Minh Le; Hoang Ha Chu; Quyet-Tien Phi
Journal:  Sci Rep       Date:  2022-07-06       Impact factor: 4.996

2.  Optimization of Wavelength Dispersive X-Ray Spectrometry Analysis Conditions.

Authors:  Stephen J B Reed
Journal:  J Res Natl Inst Stand Technol       Date:  2002-12-01

Review 3.  Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS).

Authors:  Dale E Newbury; Nicholas W M Ritchie
Journal:  J Mater Sci       Date:  2014-11-12       Impact factor: 4.220

4.  X-Ray Microanalysis in the Variable Pressure (Environmental) Scanning Electron Microscope.

Authors:  Dale E Newbury
Journal:  J Res Natl Inst Stand Technol       Date:  2002-12-01
  4 in total

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