| Literature DB >> 8678483 |
R de S Pereira1, N A Parizotto, V Baranauskas.
Abstract
Different strains of baker's yeast (Saccharomyces cerevisiae) were imaged with an atomic force microscope (AFM). The images of uncoated and nonfixed samples were reproducible with high-constrast and nanometer-resolution. Molecules from the polysaccharide surface of the cell wall were pictured and the distance of atoms was measured. The preparation of samples was easy, suggesting that AFM is a useful tool in this type of analyses.Entities:
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Year: 1996 PMID: 8678483 DOI: 10.1007/bf02787815
Source DB: PubMed Journal: Appl Biochem Biotechnol ISSN: 0273-2289 Impact factor: 2.926