| Literature DB >> 8400426 |
Abstract
An outline is presented of the first commercial environmental scanning electron microscope (ESEM). A concise description of this instrument and its operation, from a user's perspective, is given. More specifically, the description includes the electron optics, pressure stages and control, detection modes, resolution, and ancillary equipment.Mesh:
Year: 1993 PMID: 8400426 DOI: 10.1002/jemt.1070250503
Source DB: PubMed Journal: Microsc Res Tech ISSN: 1059-910X Impact factor: 2.769