| Literature DB >> 7336524 |
J Hosoi, T Oikawa, M Inoue, Y Kokubo, K Hama.
Abstract
The relative specimen thickness obtained with an energy analyser is one of the most important parameters in electron microscopy. It has been made clear that this parameter can be applied not only to inorganic specimens, but also to organic and biological specimens. Moreover, the partial specific thickness of a critical-point-dried cultured fibroblast, that is, a net thickness converted in terms of Epon, was calculated from the relative specimen thickness. The partial specific thickness of each domain of the critical-point-dried cultured fibroblast is: CC 0.05 microns, PE 0.14 microns, ED 0.32 microns and PN 0.54 microns. As a result, it is suggested that 27% of the volume of this specimen consists of biological materials.Mesh:
Year: 1981 PMID: 7336524 DOI: 10.1016/0304-3991(81)90004-8
Source DB: PubMed Journal: Ultramicroscopy ISSN: 0304-3991 Impact factor: 2.689