Literature DB >> 7288350

Whole mount observation of cultured cells by 200 kV ultrahigh resolution TEM.

J Hosoi, K Hama, T Kosaka.   

Abstract

Mesh：

Year:  1981        PMID： 7288350

Source DB:  PubMed          Journal:  J Electron Microsc (Tokyo)        ISSN： 0022-0744


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  1 in total

1.  Silicon nitride windows for electron microscopy of whole cells.

Authors:  E A Ring; D B Peckys; M J Dukes; J P Baudoin; N de Jonge
Journal:  J Microsc       Date:  2011-07-19       Impact factor: 1.758
  1 in total

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