| Literature DB >> 7022179 |
Abstract
Survival curves were obtained for haploid and diploid yeasts, Saccharomyces cerevisiae, of wild-type strains and radiosensitive mutants exposed to gamma-rays and alpha-particles. A correlation between the values of the relative biological effectiveness (RBE) of high-LET radiation and cell-repair capacity was found. The difference in radiosensitivities of the wild-type diploid strain and homozygous rad mutants incapable of recovery was significantly higher after low-LET radiation than after high-LET radiation. Possible reasons for the observed radiation responses to low- and high-LET exposure of yeast cells with various genotype are discussed.Entities:
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Year: 1981 PMID: 7022179 DOI: 10.1016/0027-5107(81)90158-5
Source DB: PubMed Journal: Mutat Res ISSN: 0027-5107 Impact factor: 2.433