Literature DB >> 68875

Relationship between amplitude of pattern displacement and visual evoked potentials.

P B Fenwick, C Turner.   

Abstract

Thirteen subjects looked at a 7 mm2 black and white checkerboard which was displaced through 0.25, 0.50, 0.75 and full pattern displacement. One hundred and twenty eight averages were taken for each displacement and the peak to peak amplitude of the visual evoked potential was measured. This showed a linear relationship between pattern displacement and size of the evoked potential. Latency was unaffected for 0.25, 0.50 and 0.75 displacement but was significantly longer for the full pattern stimulation.

Mesh:

Year:  1977        PMID: 68875     DOI: 10.1016/0013-4694(77)90197-3

Source DB:  PubMed          Journal:  Electroencephalogr Clin Neurophysiol        ISSN: 0013-4694


  2 in total

1.  The exact estimation of visual acuity by VEP technology: a report of 726 cases of eye injury.

Authors:  Guangxun Rao; Bingwei Wu; Lingli Zhang
Journal:  J Huazhong Univ Sci Technolog Med Sci       Date:  2010-02-14

2.  Versatile pattern-reversal stimulator for measuring visual evoked responses.

Authors:  T J Hughes; J F North; W P Coetzee
Journal:  Med Biol Eng Comput       Date:  1979-07       Impact factor: 2.602

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.