Literature DB >> 5797882

A new high resolution reflection scanning electron microscope.

A N Broers.   

Abstract

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Year:  1969        PMID： 5797882     DOI： 10.1063/1.1684146

Source DB:  PubMed          Journal:  Rev Sci Instrum        ISSN： 0034-6748            Impact factor:   1.523


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  2 in total

1.  Scanning reflection ion microscopy in a helium ion microscope.

Authors:  Yuri V Petrov; Oleg F Vyvenko
Journal:  Beilstein J Nanotechnol       Date:  2015-05-07       Impact factor: 3.649

Review 2.  Charged particle single nanometre manufacturing.

Authors:  Philip D Prewett; Cornelis W Hagen; Claudia Lenk; Steve Lenk; Marcus Kaestner; Tzvetan Ivanov; Ahmad Ahmad; Ivo W Rangelow; Xiaoqing Shi; Stuart A Boden; Alex P G Robinson; Dongxu Yang; Sangeetha Hari; Marijke Scotuzzi; Ejaz Huq
Journal:  Beilstein J Nanotechnol       Date:  2018-11-14       Impact factor: 3.649
  2 in total

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