| Literature DB >> 5764230 |
Abstract
The use of one-dimensional electron density strip models in interpreting low-angle X-ray data from planar and concentric multilayered structures is described. Diffraction formulas for an n-strip model are given. Fourier transforms, normalization constants, and Patterson functions are derived for certain strip models.Mesh:
Year: 1969 PMID: 5764230 PMCID: PMC1367429 DOI: 10.1016/S0006-3495(69)86381-2
Source DB: PubMed Journal: Biophys J ISSN: 0006-3495 Impact factor: 4.033