Literature DB >> 4744952

A silicon detector for the stereoscan scanning electron microscope.

A B Munden, D E Walker.   

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Year:  1973        PMID： 4744952     DOI： 10.1088/0022-3735/6/9/033

Source DB:  PubMed          Journal:  J Phys E        ISSN： 0022-3735


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  2 in total

1.  A Concept for Three-Dimensional Particle Metrology Based on Scanning Electron Microscopy and Structure-from-Motion Photogrammetry.

Authors:  Vipin N Tondare
Journal:  J Res Natl Inst Stand Technol       Date:  2020-04-29

2.  Fabrication and Characterization of a High-Performance Multi-Annular Backscattered Electron Detector for Desktop SEM.

Authors:  Wei-Ruei Lin; Yun-Ju Chuang; Chih-Hao Lee; Fan-Gang Tseng; Fu-Rong Chen
Journal:  Sensors (Basel)       Date:  2018-09-14       Impact factor: 3.576
  2 in total

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