| Literature DB >> 36186857 |
So Young Yoo1, Su Mi Park2, Chi-Hyun Choi1, Sun Ju Chung3, Soo-Young Bhang4, Jae-Won Kim5, Yong-Sil Kweon6, Jung-Seok Choi7.
Abstract
Objective: Temperament is close to susceptibility to stress and the increased level of stress may lead problematic smartphone use (PSU). In this study, the relationships between harm avoidance (HA) as a personality trait, daily traits, and PSU in children and adolescents were investigated.Entities:
Keywords: harm avoidance; mediation; personality; problematic smartphone use; stress
Year: 2022 PMID: 36186857 PMCID: PMC9515407 DOI: 10.3389/fpsyt.2022.962189
Source DB: PubMed Journal: Front Psychiatry ISSN: 1664-0640 Impact factor: 5.435
Demographics and clinical characteristics (N = 184).
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| Age (years) | 13.15 | 2.48 |
| Sex (male, %) | 138 (75.0%) | |
| Developmental period (adolescents, %) | 135 (73.4%) | |
| SAS-SV | 28.75 | 12.09 |
| SAPS | 33.32 | 8.88 |
| DHQ | 66.86 | 18.29 |
| JTCI | ||
| NS | 50.99 | 10.74 |
| HA | 49.56 | 12.02 |
| RD | 45.89 | 10.36 |
| P | 47.45 | 9.67 |
| Comorbid diagnosis | ||
| Depression | 31 (16.8%) | |
| Anxiety | 17 (9.2%) | |
| ADHD | 56 (30.4%) | |
| Other | 1 (0.5%) |
SAS-SV, Smartphone Addiction Scale-Short Version; SAPS, Korean Smartphone Addiction Proneness Scale; DHQ, Daily Hassles Questionnaire; JTCI, Junior Temperament Character Inventory; NS, Novelty Seeking; HA, Harm Avoidance; RD, Reward Dependence; P, Persistence; ADHD, attention deficit hyperactivity disorder.
Figure 1Descriptive statistics of problematic smartphone use and stress level. SAS-SV, Smartphone Addiction Scale-Short Version; SAPS, Korean Smartphone Addiction Proneness Scale; DHQ, Daily Hassles Questionnaire.
Correlation between JTCI temperament, PSU, and daily Stress.
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| Baseline | 1.NS | 1 | ||||||||||||
| 2.HA | 0.273 | 1 | ||||||||||||
| 3.RD | −0.053 | −0.058 | 1 | |||||||||||
| 4.P | −0.182 | −0.127 | 0.318 | 1 | ||||||||||
| 5.SAS-SV | 0.253 | 0.329 | 0.054 | −0.143 | 1 | |||||||||
| 6.SAPS | 0.249 | 0.333 | −0.014 | −0.227 | 0.864 | 1 | ||||||||
| 7.DHQ | 0.211 | 0.403 | −0.100 | −0.204 | 0.293 | 0.336 | 1 | |||||||
| 3 Months | 8.SAS-SV | 0.117 | 0.305 | 0.081 | −0.258 | 0.607 | 0.557 | 0.265 | 1 | |||||
| 9.SAPS | 0.136 | 0.289 | 0.057 | −0.241 | 0.575 | 0.603 | 0.240 | 0.896 | 1 | |||||
| 10.DHQ | 0.194 | 0.405 | −0.090 | −0.089 | 0.251 | 0.283 | 0.614 | 0.350 | 0.368 | 1 | ||||
| 6 Months | 11.SAS-SV | 0.099 | 0.395 | 0.051 | −0.157 | 0.619 | 0.561 | 0.355 | 0.724 | 0.703 | 0.383 | 1 | ||
| 12.SAPS | 0.106 | 0.388 | 0.005 | −0.251 | 0.538 | 0.574 | 0.418*** | 0.660 | 0.725 | 0.449 | 0.871 | 1 | ||
| 13.DHQ | −0.081 | 0.270 | −0.091 | 0.018 | 0.201 | 0.230 | 0.468 | 0.339 | 0.287 | 0.552 | 0.348 | 0.315 | 1 |
P < 0.01,
P < 0.001. JTCI, Junior Temperament Character Inventory; NS, Novelty Seeking; HA, Harm Avoidance; RD, Reward Dependence; P, persistence; PSU, Problematic Smartphone Use; SAS-SV, Smartphone Addiction Scale-Short Version; SAPS, Korean Smartphone Addiction Proneness Scale; DHQ, Daily Hassles Questionnaire.
Bootstrapped indirect effects of daily stress on the relationship between HA and PSU.
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| Baseline | HA → DHQ → SAS-SV | 0.0773 | 0.0365 | 0.0101 | 0.1549 |
| HA → DHQ → SAPS | 0.0734 | 0.0275 | 0.0239 | 0.1323 | |
| 3 Months | HA → DHQ → SAS-SV | 0.1061 | 0.0440 | 0.0317 | 0.2087 |
| HA → DHQ → SAPS | 0.0902 | 0.0333 | 0.0338 | 0.1686 | |
| 6 Months | HA → DHQ → SAS-SV | 0.0684 | 0.0389 | 0.0131 | 0.1702 |
| HA → DHQ → SAPS | 0.0441 | 0.0265 | 0.0085 | 0.1181 |
HA, Harm Avoidance; PSU, Problematic Smartphone Use; SAS-SV, Smartphone Addiction Scale-Short Version; SAPS, Korean Smartphone Addiction Proneness Scale; DHQ, Daily Hassles Questionnaire; SE, standard error; LLCI, lower level confidence interval; ULCI, upper level confidence interval.
Figure 2Mediation effects of daily stress on the relationship between HA and PSU at each time point. (A) represents results at baseline, (B) at 3 months, and (C) at 6 months. Unstandardized coefficients (β) are presented. a is effect of HA on daily stress; b is effect of daily stress on PSU; c is total effect of HA on PSU; c' is direct effect of HA on PSU. *P < 0.05, **P < 0.01, ***P < 0.001. HA, Harm Avoidance, PSU, Problematic Smartphone Use, SAS-SV, Smartphone Addiction Scale-Short Version; SAPS, Korean Smartphone Addiction Proneness Scale; DHQ, Daily Hassles Questionnaire.