| Literature DB >> 36133539 |
Wanghui Chen1,2,3, Thi Kim Ngan Nguyen1,2,3, Maxence Wilmet1,4, Noée Dumait4, Ourania Makrygenni1,2,3, Yoshio Matsui3, Toshiaki Takei5, Stéphane Cordier4, Naoki Ohashi1,3, Tetsuo Uchikoshi1,2,3, Fabien Grasset1,3.
Abstract
Transparent optical thin films for energy saving applications have recently gained substantial prominence for functional window processes. In this study, highly visible transparent nanocomposite films with ultraviolet (UV) and near-infrared (NIR) blocking capabilities are reported. Such nanocomposite films, prepared by electrophoretic deposition on ITO-coated glass, are composed of indium tin oxide (ITO) nanocrystals (9 nm) and octahedral metal atom clusters (1 nm, Nb6 or Ta6) embedded into silica nanoparticles (∼80 nm). The functional silica nanoparticles were prepared by a reverse microemulsion process. The microstructural characterization proved that ITO nanocrystals are centered in the silica nanoparticles, whereas the metal atom clusters are homogeneously distributed in the silica matrix. The optical absorption spectra of these transparent nanocomposite films exhibit distinct and complementary contributions from their ITO nanoparticles and metal atom clusters (absorption in the UV range) and from the ITO layer on silica. This journal is © The Royal Society of Chemistry.Entities:
Year: 2019 PMID: 36133539 PMCID: PMC9416910 DOI: 10.1039/c9na00400a
Source DB: PubMed Journal: Nanoscale Adv ISSN: 2516-0230
Fig. 1TEM (scale bar: 20 nm) (a) and HRTEM (scale bar: 1 nm) (b) images of the as-synthesized ITO NPs; (c) comparison of the XRD pattern of ITO NPs with the standard diffraction pattern of In2O3.
Fig. 2(a) Hydrodynamic size distribution versus intensity (from DLS measurement) of ITO NPs in water by varying the pH; (b) plots of the average hydrodynamic diameter of ITO NPs versus the pH in solution; (c) digital photographs of the RM system containing ITO NPs and ITO@Ta6 NPs.
Fig. 3Low (a) and high (b) magnification HAADF-STEM images of ITO@SiO2 NPs; (c) EDS mapping indicating the distribution of Sn L, In L and Si K in ITO@SiO2 NPs.
Fig. 4Low (a) and high (b) magnification HAADF-STEM images of ITO@Ta6@SiO2 NPs; (c) STEM image and (d) EDS spectrum (point mode) of ITO@Ta6@SiO2 NPs revealing the co-existence of Si, O, In, Sn, Ta, and Br elements.
Fig. 5Diffuse reflectance UV-Vis-NIR spectra of pure SiO2, ITO@SiO2 and ITO@Ta6@SiO2 NPs containing different concentrations of TBH (from 2 to 6.8 mM).
Fig. 6Optical photographs and SEM micrographs, surface morphology and cross sections of ITO@Nb6@SiO2 based films. These films were prepared from solution concentrations equal to 0.8 (a), 1.0 (b), and 2.5 (c, d) g L−1 and deposited by EPD at 20 V for 20 s.
Fig. 7Transmission UV-Vis-NIR spectra of the ITO@Nb6@SiO2 NP based films on the ITO-coated glass by varying the solution concentration (0.8; 1.0; and 2.5 g L−1); the spectrum of the substrate is used as a reference.
Fig. 8CIE chromaticity coordinates of the ITO@Nb6@SiO2 based films (◊ 0.8 g L−1; □ 1 g L−1; ○ 2.5 g L−1).
L*a*b* color coordinates and TL and TE values of the ITO@Nb6@SiO2 NP based films
| Sample name |
|
|
|
|
|
|---|---|---|---|---|---|
| ITO@Nb6@SiO2 20 V 20 s 0.8 g L−1 | 82.470 | 1.167 | 12.314 | 61.8 | 55.6 |
| ITO@Nb6@SiO2 20 V 20 s 1 g L−1 | 70.266 | 1.225 | 18.402 | 41.8 | 39.2 |
| ITO@Nb6@SiO2 20 V 20 s 2.5 g L−1 | 59.196 | 0.542 | 20.067 | 27.8 | 26.4 |