| Literature DB >> 36132680 |
Kasturi Vimalanathan1, Timotheos Palmer1, Zoe Gardner1, Irene Ling2, Soraya Rahpeima1,3, Sait Elmas1, Jason R Gascooke1,4, Christopher T Gibson1,4, Qiang Sun5,6, Jin Zou5,6, Mats R Andersson1, Nadim Darwish3, Colin L Raston1.
Abstract
A diversity of two-dimensional nanomaterials has recently emerged with recent attention turning to the post-transition metal elements, in particular material derived from liquid metals and eutectic melts below 330 °C where processing is more flexible and in the temperature regime suitable for industry. This has been explored for liquid gallium using an angled vortex fluidic device (VFD) to fabricate ultrathin gallium oxide (Ga2O3) sheets under continuous flow conditions. We have established the nanosheets to form highly insulating material and have electrocatalytic activity for hydrogen evolution, with a Tafel slope of 39 mV dec-1 revealing promoting effects of the surface oxidation (passivation layer). This journal is © The Royal Society of Chemistry.Entities:
Year: 2021 PMID: 36132680 PMCID: PMC9419649 DOI: 10.1039/d1na00598g
Source DB: PubMed Journal: Nanoscale Adv ISSN: 2516-0230
Fig. 1VFD mediated fabrication of ultrathin Ga2O3 sheets. (a) Schematic of the VFD illustrating its salient features. (b) Bright field TEM images of an ultrathin sheet. (c) HRTEM images illustrating the lattice spacing of the sheets of ∼0.25 nm. (d) EDS maps of the corresponding sheet in (b). (e) AFM height image of an ultrathin sheet. (f) An average thickness distribution plot based on AFM measurements and (g, h) EDX map of the ultrathin sheet confirming the presence of Ga and O on the surface of the area corresponding to the section in (g).
Fig. 2Surface characterization of the ultrathin Ga2O3 sheets. (a) XPS survey spectra of the Ga2O3 sheets. (b) High resolution XPS spectra showing two intense peaks at binding energies of 1145.03 eV and 1118.13 eV, which correspond to 2p3/2 and 2p1/2 states, respectively of the Ga2O3 sheets. (c) XRD pattern of the Ga2O3 sheets (λ = 1.79 Å). (d) Thermal analysis using TGA/DSC at 10 °C of temperature increase under N2 and (e) Auger depth profile analysis of an ultrathin Ga2O3 sheet (SEM image) and the corresponding depth profile graphs for 4 selected points (area 1–4) (figure legend: Ga; O; Si).
Fig. 3Hirshfeld surface analysis. (a and d) Hirshfeld surfaces mapped over dnorm for α- and β-Ga2O3 respectively. (b and e) Two-dimensional fingerprint plots of α- and β-Ga2O3 respectively. (c and f) Fingerprint plots delineated into Ga⋯O/O⋯Ga and O⋯O contacts for α- and β-Ga2O3 respectively.
Fig. 4Applications of the ultrathin Ga2O3 sheets. (a–c) Electrocatalytic hydrogen evolution reaction of Ga2O3 in 0.5 M H2SO4. (a) Cyclic voltammogram traces of 70.4 μg−1 cm−2 as-prepared Ga2O3 showing stripping of surface oxygen in the first scan (inset). (b) Forward scans of 70.4 μg−1 cm−2 as-prepared Ga2O3 NS under N2 (red), after first (green) and second (black) conditioning cycle between −0.8 and 1.8 V vs. RHE. The blue CV trace represents HER of 140.8 mg−1 cm−2 Ga2O3 under atmospheric gas (air). (c) Respective Tafel slopes under different gas conditions and mass-loadings. The low Tafel slope (39 mV dec−1) and low overpotential (η (1 mA cm−2) = 150 mV vs. RHE) of Ga2O3 in this study exhibits activities toward HER which are comparable to platinum group metals on carbon support,[54] transition metal phosphides[55] and hybrid metal nanoparticles.[56] (d–g) Current–potential relationship of the Ga2O3 sheets compared to silicon. (d) AFM topography image of gallium oxide sheets with thickness of 5 to 30 nm. (e) I–V measurement of Si–Ga2O3–Pt (5 nm (blue) and 30 nm (red)), and Si–Pt (black) junctions. Inset in (e) corresponds to 30 nm Ga2O3 sheet's I–V curve, in scale of nA for current. (f) AFM topography image of Ga2O3 wrinkled area with ∼100 nm thickness. (g) I–V measurement compered between Si–Ga2O3–Pt (∼100 nm (red)) and Si–Pt (black) junctions. Inset in (g) corresponds to 100 nm Ga2O3 sheet's I–V curve, in scale of pA for current. The bias is applied to the surface with bias sweep set between −6 to 6 V. *, ▲, are the location where the I–V curves were collected. Statistics were obtained by measuring the IVs at different locations around the marks in an area of 1 μm2. Lines are the average of 50 curves collected from each location.