| Literature DB >> 36071805 |
Mark A Levenstein1, Karen Robertson2, Thomas D Turner3, Liam Hunter3, Cate O'Brien4, Cedrick O'Shaughnessy3, Alexander N Kulak3, Pierre Le Magueres5, Jakub Wojciechowski6, Oleksandr O Mykhaylyk4, Nikil Kapur7, Fiona C Meldrum3.
Abstract
Recent advances in X-ray instrumentation and sample injection systems have enabled serial crystallography of protein nanocrystals and the rapid structural analysis of dynamic processes. However, this progress has been restricted to large-scale X-ray free-electron laser (XFEL) and synchrotron facilities, which are often oversubscribed and have long waiting times. Here, we explore the potential of state-of-the-art laboratory X-ray systems to perform comparable analyses when coupled to micro- and millifluidic sample environments. Our results demonstrate that commercial small- and wide-angle X-ray scattering (SAXS/WAXS) instruments and X-ray diffractometers are ready to access samples and timescales (≳5 ms) relevant to many processes in materials science including the preparation of pharmaceuticals, nanoparticles and functional crystalline materials. Tests of different X-ray instruments highlighted the importance of the optical configuration and revealed that serial WAXS/XRD analysis of the investigated samples was only possible with the higher flux of a microfocus setup. We expect that these results will also stimulate similar developments for structural biology. © Mark A. Levenstein et al. 2022.Entities:
Keywords: crystallization; microfluidics; rapid structural analysis; serial SAXS; serial WAXS
Year: 2022 PMID: 36071805 PMCID: PMC9438489 DOI: 10.1107/S2052252522007631
Source DB: PubMed Journal: IUCrJ ISSN: 2052-2525 Impact factor: 5.588
Figure 1(a) Microfluidic experimental setup on the Xeuss 2.0 SAXS/WAXS Laboratory Beamline. (b) Representative 2D WAXS patterns from the flow of water-in-oil droplets within the device collected with 0.5 s exposures. The zoomed-in inset shows a possible reflection from the (104) plane of calcite formed during a rapid precipitation process within the droplets. (c) Integrated 1D diffraction pattern of the right frame of (b) showing that the possible 104 reflection was not preserved during data reduction. (d) Representative 2D SAXS patterns collected from 0.5 s exposures that show the characteristic scattering of oil and water droplets containing silica nanoparticles. The insets illustrate the path of the X-ray beam through the microchannel, either encountering the continuous oil phase or a droplet containing nanoparticles. (e) Serial 2D (left) and 1D (right) SAXS patterns of silica nanoparticles obtained from automated combination of multi-frame scattering data (30 s cumulative exposure time). The dotted line is a polydisperse sphere form factor fitted to the I(q) curve taking into account beam convolution.
Figure 2(a) Experimental setup on the XtaLAB Synergy-R single-crystal diffractometer illustrating both the microfluidic and the millifluidic devices that were utilized. (b) Representative 2D XRD patterns showing the characteristic scattering of water-in-oil droplets within the microfluidic device collected with 25 ms exposures. The zoomed-in inset shows a 104 reflection from calcite. (c) Integrated and background-subtracted 1D diffraction pattern of the right frame of (b) showing that the 104 reflection was preserved during data reduction. (d) Serial 2D (left) and 1D (right) diffraction patterns of calcite crystals obtained from automated background subtraction and combination of multi-frame diffraction data (90 s cumulative exposure time). The diffraction peaks are labelled with their corresponding reflections. (e) Serial 2D (left) and 1D (right) diffraction patterns of PCM I crystals obtained from automated background subtraction and combination of multi-frame diffraction data (90 s cumulative exposure time). The diffraction peaks are labelled with their corresponding reflections. The insets in (d) and (e) illustrate the path of the X-ray beam through the microchannel, where only diffraction frames corresponding to slurry plugs are integrated into the final serial diffraction patterns.
X-ray source and beam characteristics
| Instrument | Source | Energy (keV) | Beam size, H × W (µm) | Flux at sample (ph s−1) | Flux density (ph s−1 µm−2) |
|---|---|---|---|---|---|
| Xeuss 2.0 SAXS/WAXS Beamline | MetalJet D2+ (Ga) | 9.24 | ∼250 × 250 | 3.7 × 106 | 5.9 × 101 |
| XtaLAB Synergy-R Diffractometer | PhotonJet-R (Cu) | 8.05 | ∼140 × 140 | 5.7 × 109 | 2.9 × 105 |