| Literature DB >> 36045641 |
José David Arregui-Mena1, D V Griffiths2, Robert N Worth3, Christa E Torrence1,4, Aaron Selby5, Cristian Contescu1, Nidia Gallego1, Philip D Edmondson1, Paul M Mummery3, Lee Margetts3.
Abstract
This manuscript provides optical microscopy, scanning electron microscopy, and transmission electron microscopy micrographs that show the microstructure of three superfine nuclear graphite grades IG-110, 2114 and ETU-10. This collection of microstructural data showcases the microstructure of these materials and helps to differentiate the most important features or phases of these graphite grades. In particular, the microstructural data illustrate the filler and binder morphology of these grades. Moreover, samples of as-received and oxidized IG-110 were characterized via optical microscopy and x-ray computed tomography. The microstructural data of oxidized IG-110 shows the porosity generated by oxidation experiments. These micrographs and data provide a unique insight into the microstructural features and oxidation effects in nuclear graphite and can be used to perform quantitative porosity analysis. This collection of microstructural data complements the modeling and characterization described in the associated manuscript, "Using porous random fields to predict the elastic modulus of unoxidized and oxidized superfine graphite (Arregui-Mena et al., 2022)."Entities:
Keywords: MICROSCOPY; Microstructure; Modelling; Nuclear graphite; SEM; TEM
Year: 2022 PMID: 36045641 PMCID: PMC9421309 DOI: 10.1016/j.dib.2022.108535
Source DB: PubMed Journal: Data Brief ISSN: 2352-3409
Fig. 1Polarized optical, SEM, and TEM micrographs of the selected graphite grades. Filler (F), binder (B), and porosity (P) features are indicated.
Fig. 2Optical micrographs of unoxidized and oxidized samples of IG-110. WL – Weight loss.
Fig. 3Reconstructed XCT data, segmentations of IG-110 unoxidized and uniformly oxidized samples, and open and closed porosity profiles across the data.
List of surveyed materials and description of selected graphite grades.
| Graphite grade | Coke source | Forming process | Type | Grain size (µm) | Manufacturer | Application | Ref. |
|---|---|---|---|---|---|---|---|
| 2114 | Nonpetroleum coke | Isostatically molded | Superfine | 13 | Mersen | Gen IV reactors | |
| ETU-10 | Coal-tar pitch | Isostatically pressed | Superfine | 15 | Ibiden | Gen IV reactors | |
| IG-110 | Petroleum coke | Isostatically pressed | Superfine | 20 | Toyo Tanso | Gen IV reactors |
Fig. 4Sample polishing preparation process.
Oxidation parameters and techniques used to characterize IG-110 specimens.
| Techniques | Oxidation temperature (C°) | Weight loss (%) |
|---|---|---|
| Optical microscopy/XCT | Unoxidized | — |
| Optical microscopy/XCT | 525 | 4.5 |
| Optical microscopy/XCT | 10 | |
| Optical microscopy | 600 | 5 |
| Optical microscopy | 10 | |
| Optical microscopy | 750 | 5 |
| Optical microscopy | 10 | |
Fig. 5Processing of open and closed porosity
| Subject | Materials Characterization |
| Specific subject area | Material simulations and characterization of nuclear materials |
| Type of data | Tables – Descriptions of the selected graphite grades’ pores and other characteristics |
| How data were acquired | Transmission electron microscopy: JEOL JEM 2100F Scanning electron microscopy: Tescan MIRA3 GMH SEM X-ray computed tomography: Zeiss Xradia 620 Versa. Optical microscopy: Nikon Microphot FXA and the Leica Application Suite software for unoxidized samples. Keyence digital microscope for oxidized samples. |
| Data format | The data were processed and included as images in the paper. |
| Parameters for data collection | Transmission electron microscopy: JEOL JEM 2100F: acceleration voltage 200 kV Scanning electron microscopy: Tescan MIRA3 GMH SEM: acceleration voltage 2 kV, beam current 8 µA X-ray computed tomography: Zeiss Xradia 620 Versa: acceleration voltage 40 kV, power 5 W, current ∼75 µA, source–sample distance: 12 mm, source–detector distance: 37.5 mm, 1601 projections with 13 s acquisition time. |
| Description of data collection | The data were collected using multiple characterization techniques, including optical microscopy, x-ray computed tomography, and scanning electron microscopy |
| Data source location | Institution: The US Department of Energy's Oak Ridge National Laboratory – Low Activation Materials Development and Analysis Laboratory |
| Data accessibility | Included with the article and the raw data is provided in the following repository: |
| Related research article | J.D. Arregui-Mena, D.V. Griffiths, R.N. Worth, C.E. Torrence, A. Selby, C. Contescu, N. Gallego, P.D. Edmondson, P.M. Mummery, L. Margetts, Using porous random fields to predict the elastic modulus of unoxidized and oxidized superfine graphite, Materials & Design 220 (2022) 110840. |