| Literature DB >> 36014622 |
Luciana Punga1, Abderrahman Abbassi2, Mihaela Toma1, Teodor Alupului1, Corneliu Doroftei3, Marius Dobromir4, Daniel Timpu5, Florica Doroftei5, Laura Hrostea6, George G Rusu1, Abdelati Razouk7, Felicia Iacomi1.
Abstract
Highly transparent thin films with the chemical formula BaSrMgWO6 were deposited by spin coating using a solution of nitrates of Ba, Sr, and Mg and ammonium paratungstate in dimethylformamide with a Ba:Sr:Mg:W ratio = 1:1:1:1. XRD, SEM, EDX, and XPS investigations evidenced that annealing at 800 °C for 1 h results in an amorphous structure having a precipitate on its surface, and that supplementary annealing at 850 °C for 45 min forms a nanocrystalline structure and dissolves a portion of the precipitates. A textured double perovskite cubic structure (61.9%) was found, decorated with tetragonal and cubic impurity phases (12.7%), such as BaO2, SrO2, and MgO, and an under-stoichiometric phase (24.4%) with the chemical formula Ba2-(x+y) SrxMgyWO5. From transmittance measurements, the values of the optical band gap were estimated for the amorphous (Egdir = 5.21 eV, Egind = 3.85 eV) and nanocrystalline (Egdir = 4.69 eV, Egind = 3.77 eV) phases. The presence of a lattice disorder was indicated by the high Urbach energy values and weak absorption tail energies. A decrease in their values was observed and attributed to the crystallization process, lattice strain diminution, and cation redistribution.Entities:
Keywords: double perovskite; optical properties; structure; thin films; tungstate
Year: 2022 PMID: 36014622 PMCID: PMC9414463 DOI: 10.3390/nano12162756
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.719
Structural characterization of thin films.
| Sample | Post Deposition Annealing | a | V | Dm | Symmetry | Tolerance Factor, t | ε |
|---|---|---|---|---|---|---|---|
| BSMWO−I | 800 °C, 1 h | - | - | amorphous | |||
| BSMWO−II | 800 °C 1 h and 850 °C, 45 min | 8.1954 ± 0.0757 | 550.436 ± 15.257 | 42.70 ± 0.05 | Fm-3m | 1.012 ± 0.005 | 2.22 ± 0.05 |
Figure 1XRD patterns of thin films deposited by spin coating and annealed at different temperatures: BSMWO−I—black line, 800 °C, 1 h; BSMWO−I—red line, 800 °C, 1 h and 850 °C, 45 min. XRD patterns are compared with three possible impurity phases that may exist. The XRD peaks noted with * and ** may have contributions from the tetragonal BaO2 and SrO2 phases.
Figure 2SEM images: (a) BSMWO−on quartz substrate; (b) BSMWO−II on quartz substrate; (c) BSMWO−I on (111) Si p substrate; (d) BSMWO−II on (111) Si p substrate.
Figure 3EDX spectra belonging to 8 different areas of the BSMWO−II SEM image: (a) SEM image; (b) EDX spectra. The investigated area and the corresponding spectra are marked with the same colors.
EDX chemical elemental composition of BSMWO−II thin film.
| Elements | Area 1 | Area 2 | Area 3 | Area 4 | Area 5 | Area 6 | Area 7 | Area 8 |
|---|---|---|---|---|---|---|---|---|
| C K | 34.6 | 31.1 | 30.4 | 34.1 | 28.5 | 27.8 | 28.7 | 30 |
| O K | 44.1 | 46.6 | 47 | 44.7 | 47.6 | 47.3 | 47.5 | 46.3 |
| Si K | 19.6 | 20.9 | 21.2 | 19.3 | 22.7 | 22.8 | 22.6 | 22.5 |
| Mg K | 0.2 | 0.3 | 0.3 | 0.3 | 0.3 | 0.3 | 0.3 | 0.3 |
| Sr L | 0.3 | 0.3 | 0.3 | 0.3 | 0.2 | 0.4 | 0.4 | 0.4 |
| Ba L | 0.8 | 0.5 | 0.4 | 0.8 | 0.2 | 0.2 | 0.2 | 0.2 |
| W L | 0.2 | 0.1 | 0.2 | 0.2 | 0.2 | 0.2 | 0.2 | 0.2 |
| Pt L | 0.2 | 0.2 | 0.2 | 0.2 | 0.2 | 0.1 | 0.2 | 0.2 |
Figure 4High-resolution XPS spectra of BSMWO−II thin film: (a) Ba 3d; (b) Sr 3d; (c) Mg 1s; (d) W 4f; (e) O 1s; (f) C 1s. Red line indicates species in cubic coordination in double perovskite structure, blue line indicates surface species, and orange line indicates adsorbed species.
Binding energies of elements Ba 3d, Sr 3d, Mg 1s, O 1s, and C 1s observed in BSMWO−II high-resolution spectra, (eV), peak area (%), and attribution.
| Compound | BE (eV) | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| Ba 3d | Sr 3d | Mg 1s | W 4f | O 1s | C1s | ||||
| 3d5/2 | 3d3/2 | 3d5/2 | 3d3/2 | 1s | 4f7/2 | 4f5/2 | 1s | 1s | |
| BaSrMgWO6 | 779.96 | 795.48 | 133.18 | 134.88 | 1304.27 | 37.60 | 39.90 | 530.11 | |
| Peak area % | 61.9 | 61.9 | 61.9 | 61.9 | 33.3 | ||||
| Ba2−(x+y) SrxMgyWO5 | 781.48 | 797.02 | 135.12 | 136.73 | 1305.33 | 35.93 | 38.73 | 531.63 | |
| Peak area, % | 25.4 | 25.4 | 25.4 | 38.1 | 22.7 | ||||
| BaO2, SrO2 MgO | 782.32 | 797.71 | 136.33 | 137.33 | 1306.33 | 531.87 | |||
| Peak area, % | 12.7 | 12.7 | 12.7 | 11.4 | |||||
| C-C | 284.6 | ||||||||
| Peak area, % | 46.7 | ||||||||
| OH; C-OH | 532.68 | 286.27 | |||||||
| Peak area, % | 18.4 | 31.6 | |||||||
| H2O, O2 C=O | 534.00 | 287.41 | |||||||
| Peak area, % | 14.2 | 21.7 | |||||||
Elemental chemical composition of BSMWO−II thin film.
| Compound | Elements, Atomic % | ||||
|---|---|---|---|---|---|
| O | Ba | Sr | Mg | W | |
| BaS rMgWO6 | 40.39 | 5.38 | 5.38 | 5.38 | 5.38 |
| Ba2−(x+y) SrxMgyWO5 | 16.57 | 2.21 | 2.21 | 2.21 | 3.31 |
| BaO2, SrO2, MgO | 8.29 | 1.10 | 1.1 | 1.10 | 0.00 |
| Total | 65.25 | 8.69 | 8.69 | 8.69 | 8.69 |
Figure 5Optical properties of BSMWO−I and BSMWO−II thin films: (a) transmittance spectra; (b) absorption coefficient; (c) determination of optical band gap energy for a direct transition; (d) determination of optical band gap energy for an indirect transition; (e) determination of Urbach and UTW energies; (f) thin-film characteristics.
Thin-film optical properties: transmittance, T; absorption coefficient, α; bang gap energy for direct and indirect transitions, E, E: Urbach energy, E; and weak absorption tail energy, E
| Sample | α (2.75 eV) | ||||||
|---|---|---|---|---|---|---|---|
| BSMWO−I | 150 | 88.3 | 6734.6 | 5.21 | 3.90 | 0.756 | 1.433 |
| BSMWO−II | 150 | 83.3 | 9705.7 | 4.69 | 3.77 | 0.610 | 0.914 |