| Literature DB >> 35957026 |
Amin Alibakhshi1, Sasan Rahmanian2, Shahriar Dastjerdi3, Mohammad Malikan4, Behrouz Karami5, Bekir Akgöz3, Ömer Civalek3,6.
Abstract
The impetus of writing this paper is to propose an efficient detection mechanism to scan the surface profile of a micro-sample using cantilever-based atomic force microscopy (AFM), operating in non-contact mode. In order to implement this scheme, the principal parametric resonance characteristics of the resonator are employed, benefiting from the bifurcation-based sensing mechanism. It is assumed that the microcantilever is made from a hyperelastic material, providing large deformation under small excitation amplitude. A nonlinear strain energy function is proposed to capture the elastic energy stored in the flexible component of the device. The tip-sample interaction is modeled based on the van der Waals non-contact force. The nonlinear equation governing the AFM's dynamics is established using the extended Hamilton's principle, obeying the Euler-Bernoulli beam theory. As a result, the vibration behavior of the system is introduced by a nonlinear equation having a time-dependent boundary condition. To capture the steady-state numerical response of the system, a developed Galerkin method is utilized to discretize the partial differential equation to a set of nonlinear ordinary differential equations (ODE) that are solved by the combination of shooting and arc-length continuation method. The output reveals that while the resonator is set to be operating near twice the fundamental natural frequency, the response amplitude undergoes a significant drop to the trivial stable branch as the sample's profile experiences depression in the order of the picometer. According to the performed sensitivity analysis, the proposed working principle based on principal parametric resonance is recommended to design AFMs with ultra-high detection resolution for surface profile scanning.Entities:
Keywords: atomic force microscopy; developed Galerkin method; hyperelastic microcantilever; non-contact cantilever; shooting and arc-length continuation method; softening resonance
Year: 2022 PMID: 35957026 PMCID: PMC9370785 DOI: 10.3390/nano12152598
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.719
Figure 1The schematic view of an AFM’s cantilever scanning a sample. (a) 3D view of the AFM. (b) 2D view of the cantilever.
Figure 2Schematic representation of the increase and decrease in surface profile.
The material and geometrical parameters of the AFM cantilever.
| Parameter | Value |
|---|---|
| Modulus of elasticity, | 3 GPa |
| Length, | 225 |
| Cross-section area, |
|
| The second moment of area, |
|
| Hamaker constant, | |
| Tip radius, | 10 nm |
| Initial tip–sample distance, | 60 nm |
| Poisson’s ratio | 0.49 |
Figure 3Frequency-response behavior of the AFM in the neighbor of its principal parametric resonance for different values of the base-excitation amplitude.
Figure 4Instability tongue. The loci of both sub- and super-critical primary Hopf bifurcation points define the boundary of the parametric resonance region, where the threshold value for the base excitation amplitude is .
Figure 5The impact of Poisson’s ratio on the frequency-displacement behavior of the AFM, for . The dashed and solid lines are unstable and stable branches, respectively.
Figure 6The influence of the surface profile variations on the primary Hopf bifurcation points near parametric resonance for the base excitation amplitude of . The dashed and solid lines are unstable and stable branches, respectively.
Figure 7The influence of the surface profile variations on the resonance amplitude of the microcantilever near primary resonance, for .
Figure 8The influence of the surface profile variations on the amplitude of the resonator’s displacement at cyclic-fold bifurcation near parametric resonance, for . The dashed and solid lines are unstable and stable branches, respectively.