| Literature DB >> 35922503 |
Mihyang Sheen1, Yunhyuk Ko2, Dong-Uk Kim2, Jongil Kim3, Jin-Ho Byun4, YongSeok Choi5, Jonghoon Ha5, Ki Young Yeon2, Dohyung Kim2, Jungwoon Jung2, Jinyoung Choi2, Ran Kim2, Jewon Yoo2, Inpyo Kim2, Chanwoo Joo2, Nami Hong2, Joohee Lee2, Sang Ho Jeon2, Sang Ho Oh3, Jaekwang Lee4, Nari Ahn2, Changhee Lee6.
Abstract
Indium gallium nitride (InGaN)-based micro-LEDs (μLEDs) are suitable for meeting ever-increasing demands for high-performance displays owing to their high efficiency, brightness and stability1-5. However, μLEDs have a large problem in that the external quantum efficiency (EQE) decreases with the size reduction6-9. Here we demonstrate a blue InGaN/GaN multiple quantum well (MQW) nanorod-LED (nLED) with high EQE. To overcome the size-dependent EQE reduction problem8,9, we studied the interaction between the GaN surface and the sidewall passivation layer through various analyses. Minimizing the point defects created during the passivation process is crucial to manufacturing high-performance nLEDs. Notably, the sol-gel method is advantageous for the passivation because SiO2 nanoparticles are adsorbed on the GaN surface, thereby minimizing its atomic interactions. The fabricated nLEDs showed an EQE of 20.2 ± 0.6%, the highest EQE value ever reported for the LED in the nanoscale. This work opens the way for manufacturing self-emissive nLED displays that can become an enabling technology for next-generation displays.Entities:
Year: 2022 PMID: 35922503 DOI: 10.1038/s41586-022-04933-5
Source DB: PubMed Journal: Nature ISSN: 0028-0836 Impact factor: 69.504