| Literature DB >> 35864864 |
Yong Wang1,2,3, Xiushuo Zhang1,2,3, Jing Xu1,2, Xiangyu Sun4, Xiaolong Zhao1,2, Hongsheng Li1,2,3, Yanping Liu1,2,3, Jingjing Tian1,2, Xiaorui Hao1,2, Xiaofei Kong1,2, Zhiwei Wang1,2, Jie Yang1,2, Yuqing Su1,2.
Abstract
As a typical microscopic imaging technology, the emergence of the microscope has accelerated the pace of human exploration of the micro world. With the development of science and technology, microscopes have developed from the optical microscopes at the time of their invention to electron microscopes and even atomic force microscopes. The resolution has steadily improved, allowing humans to expand the field of research from the initial animal and plant tissues to microorganisms such as bacteria, and even down to the nanolevel. The microscope is now widely used in life science, material science, geological research, and other fields. It can be said that the development of microscopes also promotes the development of micro- and nanotechnology. It is foreseeable that microscopes will play a significant part in the exploration of the microworld for a long time to come. The development of microscope technology is the focus of this study, which summarized the properties of numerous microscopes and discussed their applications in micro and nanotechnology. At the same time, the application of microscopic imaging technology in micro- and nanofields was investigated based on the properties of various microscopes.Entities:
Keywords: expectation; imaging; micro-nano; microscopic; review
Year: 2022 PMID: 35864864 PMCID: PMC9294601 DOI: 10.3389/fchem.2022.931169
Source DB: PubMed Journal: Front Chem ISSN: 2296-2646 Impact factor: 5.545
FIGURE 1Near-field scanning optical microscope probe (Dunn et al., 2009).
FIGURE 2Polarization microscope based on division-of-focal plane (DoFP) polarimeter (Chang et al., 2016).
FIGURE 3Structure diagram of low temperature fluorescence microscope (Li et al., 2015).
FIGURE 4Principle diagram of laser confocal scanning microscope (Evans and Donahue, 2008).
FIGURE 5TEM principle diagram (Feist et al., 2015).
FIGURE 6structure of the SEM (Chen et al., 2013).
FIGURE 7High-resolution scanning electron microscope (Amirthapandian, 2010).
FIGURE 8Scanning tunneling microscope (Snv et al., 2020)
FIGURE 9Schematic diagram of atomic force microscopy (Zhang, 2002).
FIGURE 10SEM image of AFM platinum-iridium layer probe (Kim et al., 2015).
Summary of the characteristics of all the microscopes mentioned in the study.
| Resolution | Work environment | Principle | |
|---|---|---|---|
| Traditional optical microscope | 0.2 µm | Atmospheric | Optical principle |
| Near-field scanning optical microscope | 60–100 nm | Atmospheric | Near-field optics |
| Polarization microscope | 0.2 µm | Atmospheric | Polarization optics |
| Fluorescence microscope | 0.2 µm | Atmospheric | Fluorescence of the sample to be measured using UV excitation |
| Laser confocal scanning microscope | 0.12 µm | Atmospheric | Laser scanning |
| Transmission electron microscope | 0.2 nm | Vacuum | Collecting transmission electrons for imaging |
| Scanning electron microscope | 1 nm | Vacuum | Collecting secondary electrons for imaging |
| Scanning transmission electron microscopy | 1 nm | Vacuum | Collecting scattered electrons for imaging |
| Scanning tunneling microscope | 0.2 nm | Vacuum | Exploiting the tunneling effect in quantum theory |
| Atomic force microscope | 0.1 nm | Vacuum | Detecting changes in atomic forces on the surface of the object to be measured using a probe |