| Literature DB >> 35818386 |
Paweł Wojciechowski1,2, Mikołaj Lewandowski1.
Abstract
The current state-of-the-art in the growth, structure, and physicochemical properties of iron nitride thin films is presented. First, different iron nitride phases are introduced based on their crystallographic structure and the Fe-N phase diagram. Second, preparation methods for thin iron nitride films are described. Next, the structure, electronic, and magnetic properties of the films are discussed. Finally, potential applications of iron nitride films, as well as the challenges to be faced in the field, are highlighted. This Review constitutes a starting point for anyone who would like to conduct research on these fascinating materials, the scientific and technological potential of which has not been fully explored to date.Entities:
Year: 2022 PMID: 35818386 PMCID: PMC9267165 DOI: 10.1021/acs.cgd.1c01528
Source DB: PubMed Journal: Cryst Growth Des ISSN: 1528-7483 Impact factor: 4.010
Figure 1Fe–N phase diagram. Reprinted figure with permission from ref (32). Copyright 2004 by the American Physical Society.
Figure 2Crystallographic structure of selected Fe–N phases and the top views of their possible low-index surfaces: (a) γ′′-FeN zinc blende structure, (b) γ′′′-FeN rock salt structure, (c) γ′-Fe4N perovskite structure, and (d) α′′-Fe16N2 body-centered tetragonal structure. Gold spheres in (a) and (b) represent Fe atoms, while in (c) and (d) they correspond to Fe-I atoms. Red and green spheres in (c) and (d) represent Fe-II and Fe-III atoms, respectively, while silver spheres correspond to N atoms. The illustration was made using the VESTA software.[43]
Basic Information on the Structure and Magnetic Properties of the Most Commonly Occurring Iron Nitride Phases
| phase | α-Fe | α′′-Fe16N2 | α′-Fe8N | γ′-Fe4N | ε-Fe | ε-Fe | ζ-Fe2N | γ′′-FeN | γ′′′-FeN |
|---|---|---|---|---|---|---|---|---|---|
| space group | |||||||||
| lattice constants | |||||||||
| magnetic ordering | ferro- | ferro- | ferro- | ferro- | ferro- | ferro- | ferro- | para- | antiferro- |
| 1044 K[ | 813 K[ | 770 K[ | 769 K[ | 558 K[ | 13 K[ | 4 K (bulk)[ | N/A | 100 K[ | |
| 35 K (thin film)[ | |||||||||
| μAv/Feat | 2.22 μB[ | 3.3 μB[ | 2.5 μB[ | 2.01 μB[ | 1.45 μB[ | 0.17 μB[ | 0.06 μB (bulk)[ | N/A | 2.51 μB[ |
| 0.028 μB (thin film)[ |
Figure 3Theoretically calculated high-pressure phase diagrams of iron nitrides. The left image is reprinted with permission from ref (71) under the terms of the Creative Commons CC BY license. Published by Springer Nature. The right image is reprinted with permission from ref (66). Copyright 2018 American Chemical Society.
Figure 4(Left) XRD patterns of iron nitride films grown on glass substrates using PLD of Fe in N2 with pressures ranging from 5 × 10–6 mbar to 1 × 10–2 mbar (a → f); (c) shows the spectrum obtained for the film grown using the same N2 pressure as the one in (b) but additionally annealed in nitrogen at 110 °C for 25 h. (Right) XRD patterns of films obtained using GD-PLD (nitrogen plasma) at 200 °C (a) and room temperature (b). Reprinted with permission from ref (72). Copyright 2001 Elsevier.
Figure 5Dependence of the nitrogen content in thin iron nitride films grown by N2- and N2 + H2-plasma-assisted MBE on the nitrogen pressure divided by the iron growth rate. Solid lines are a guide to the eye. Reprinted from ref (95) with permission. Copyright 2001 AIP Publishing.
Overview of the Literature Data on the Structure of Thin Iron Nitride Films Grown Using Different Methods
| ref | iron nitride phase | film thickness [Å] | substrate | growth method | structure | characterization methods | year |
|---|---|---|---|---|---|---|---|
| ( | α′′-Fe16N2 | 500 | glass | MBE of Fe in N2 | polycrystalline, multiphase (no detailed description) | magnetometry, RHEED | 1972 |
| γ′-Fe4N | |||||||
| ( | ε-Fe3–2N | 50000 | glass | CVD using Fe(CO)5, NH3, H2, and Ar | amorphous at 50 °C; columnar structure at 200 °C | SEM, XRD, magnetometry | 1986 |
| ( | γ′-Fe4N | 300–600 | glass | CVD using HFe4(CO)12N | amorphous (no detailed description) | XRD, XPS, AES, CEMS | 1990 |
| ( | γ′-Fe4N | No data | fused silica | CVD using Fe(C5H5)2, NH3, H2, and CO2 | polycrystalline, grain structure | XRD, VSM, SEM | 1990 |
| ε-Fe3–2N | |||||||
| ( | α′′-Fe16N2 | 500, 1000 (100–300 with Fe buffer layer) | InGaAs(001) | MBE of Fe in N2 + NH3 (pure N2 for Fe buffer layer) | epitaxial, single-crystal, single-phase | VSM, TEM, RHEED, XRD | 1991 |
| ( | α′′-Fe16N2 | 200–900 | InGaAs(001) | MBE of Fe in N2 + NH3 | single-crystal, single-phase | XPS, AES, TEM, XRD, RHEED, VSM, CEMS | 1994 |
| α′-Fe8N | |||||||
| ( | α′-Fe8N | 200–850 | Ag/Fe(3 nm)/MgO(001) | DC magnetron sputtering of Fe in N2 + Ar (α′), annealing in N2 (α′′) | epitaxial, multiphase | XRD, VSM, CEMS (parameters given, but no spectra included) | 1994 |
| α′′-Fe16N2 | |||||||
| ( | α′′-Fe16N2 | 300–900 | GaAs(001) | MBE of Fe in N2 + NH3 | epitaxial, single-crystal, single-phase | RBS, FMR, SQUID, VSM, DC four-point probe electric measurements | 1996 |
| ( | ζ-Fe2N | 5–300 | Si(001) | RF magnetron sputtering of Fe in N2 + Ar | polycrystalline, single-phase | XRD, SAXS, TEM, SQUID | 1996 |
| ( | ε-Fe3N | ∼10000 | polycrystalline Ti | CVD using iron acetylacetate, NH3, and N2 | polycrystalline, grain structure | XRD, SEM, EDX | 1998 |
| ( | ε-Fe3N | 900–5000 | glass | CVD using FeCl3, NH3, and N2 | smooth, single-phase (no detailed description) | XRD, SEM, VSM | 1999 |
| ( | ε-Fe3N | 10000–50000 | glass | CVD using FeCl3, NH3, and N2 | single-phase (no detailed description) | XRD, SEM, VSM | 2000 |
| ( | α′′-Fe16N2 | no data | glass | PLD of Fe in N2, GD-PLD of Fe in a nitrogen plasma | multiphase (no detailed description) | XRD, CEMS | 2001 |
| γ′-Fe4N | |||||||
| γ′′′-FeN | |||||||
| ε-Fe3N | |||||||
| ζ-Fe2N | |||||||
| ( | FeN | 1310 | glass | sputtering of Fe in N2 + Ar | amorphous, grain-structure (typical grain size ∼30 nm), RMS roughness <1 nm | CEMS, XRD (no pattern included), AFM, XPS, XRR | 2001 |
| ( | γ′-Fe4N | No data | MgO(001) | CVD using FeCl3, NH3, and N2 | epitaxial, single-phase, RMS roughness 0.5 nm | XRD, SEM, AFM, VSM, TEM, light reflectivity | 2001 |
| ( | γ′-Fe4N | 300–1000 | MgO(001) | MBE of Fe in NH3, NH3 passed through a hot nozzle and RF N2 or N2 + H2 plasma | epitaxial, single-crystal, single-phase | XRD, CEMS, ERD, RBS | 2002 |
| ( | γ′-Fe4N | 1140–2350 | SiO2(300 nm)/Si(001) | PLD of Fe in N2 | multiphase (no detailed description) | XRD, VSM, AFM (no image included), XPS (no spectra included) | 2003 |
| ε-Fe3N | |||||||
| ( | γ′-Fe4N | 2–10 (up to 5 MLs) | Cu(100) | MBE of Fe in RF N2 + H2 plasma | single-phase, single-crystal;
<1 ML: embedded islands; 1 ML: islands, 2.2 Å high; >1 ML: films with 0.5 and 1.9 Å steps and | LEED, AES, STM, XRD, CEMS | 2003 |
| ( | α′-Fe8N | 65, 160, 330, 420 | MgO(001), Fe(42 nm)/MgO(001) | MBE of Fe in N2, postnitriding in N2 (α′′) | no detailed description | CEMS | 2003 |
| α′′-Fe16N2 | |||||||
| γ′-Fe4N | |||||||
| γ′′-FeN | |||||||
| γ′′′-FeN | |||||||
| ε-Fe | |||||||
| ( | γ′-Fe4N | <1 ML (2 Å) up to 270 MLs (∼1000 Å) | Cu(100) | MBE of Fe in RF N2 plasma | <1 ML: embedded islands; >1 ML: terraces, flat surface | STM, AES, XRD, LEED, CEMS | 2004 |
| ( | γ′-Fe4N | <5 (up to 2.3 MLs) | Cu(100) | MBE of Fe in RF N2 + H2 plasma | epitaxial, square islands with lateral sizes of ∼10 nm | STM, LEED, AES | 2004 |
| ( | ζ-Fe2N | 1200 | SiO2/Si(001) | DC magnetron sputtering of Fe in N2 + Ar | polycrystalline, grain structure (20 nm on average) + iron oxide | XRD, TEM, XPS (no spectra included), SQUID | 2004 |
| ( | γ′-Fe4N | 400 | Cu(100) | MBE of Fe in RF N2 plasma | epitaxial, single-phase, single-crystal, atomically flat surface | STM, LEIS, DFT | 2005 |
| ( | γ′-Fe4N | 18 | Cu(100) | MBE of Fe in RF N2 plasma | reconstructed | STM, LEED, XRD, XPS, UPS, AES, DFT | 2007 |
| ( | γ′-Fe4N | up to 500 | Cu(001) | MBE of Fe in RF N2 + H2 plasma | smooth surface regardless of the film thickness | STM, AES, LEED, MOKE | 2007 |
| ( | γ′′-FeN | 9 | MgO(001) | MBE of Fe in RF N2 plasma | single-phase (no detailed description) | LEED, XPS, UPS, AES, XRD, DFT | 2008 |
| ( | γ′-Fe4N | up to 500 | Cu(100) | MBE of Fe in RF N2 plasma | epitaxial, single-phase, single-crystal, atomically flat surface | STM, LEED, MOKE | 2008 |
| ( | γ′-Fe4N | 100–500 | Si(001) | DC magnetron sputtering of Fe in N2 + Ar | grain structure with sizes up to 20 nm (no detailed description) | XRD, DC four-point probe electric measurements, SIMS | 2009 |
| ( | γ′-Fe4N | 3000 | SiO2(100 nm)/Si(001) | CVD using FeCl2, N2, H2, and Ar | multiphase, grain structure (500 nm for γ′, 350 nm for ε and 100 nm for ζ) | XRD, SEM, SQUID | 2009 |
| ε-Fe3N | |||||||
| ζ-Fe2N | |||||||
| ( | γ′-Fe4N | 32 | Cu(100) | MBE of Fe in a flux of atomic nitrogen | no detailed description | XPS, MOKE, LEED, XRD (no pattern included) | 2009 |
| γ′′-FeN | |||||||
| ( | ε-Fe3N | 300–1500 | glass | DC magnetron sputtering of Fe in N2 + Ar | polycrystalline, grains 5–50 nm, RMS roughness 8–20 nm (both values increasing with film thickness) | XRD, TEM, SEM, AFM, SQUID | 2009 |
| ζ-Fe2N | |||||||
| ( | γ′-Fe4N | 40 | Si(001) | DC reactive magnetron sputtering of Fe in N2 + Ar | no detailed description | DC four-point probe electric measurements | 2010 |
| ( | γ′′-FeN | 30 | Fe(001) | exposing a Fe(001) substrate to RF N2 plasma | single-phase (no detailed description) | LEED, XPS, UPS, XRD, DFT | 2010 |
| ( | γ′-Fe4N | 2000 | Fe(20 nm)/Si(001) | PLD of Fe in N2 | columnar microstructure with ∼110 nm grains, RMS roughness ∼10 nm | XRD, TEM, SQUID, MOKE | 2011 |
| ( | γ′′-FeN | no data | Al (crystallographic orientation not provided) | PLD of Fe in N2 | no detailed description | Mössbauer spectroscopy, XRD (phase composition, no pattern included) | 2011 |
| γ′′′-FeN | |||||||
| ( | γ′-Fe4N | 80–300 | LaAlO3(001),
SrTiO3(001), MgO(001) | MBE of Fe in RF N2 plasma | single-phase, smooth surface with RMS roughness ∼0.25 nm; epitaxial growth only for LaAlO3 and SrTiO3 | RHEED, AFM, TEM, STEM, EELS | 2011 |
| ( | γ′-Fe4N | 100 | SrTiO3(001) | MBE of Fe in RF N2 plasma | epitaxial, single-phase (no detailed description) | XRD, RHEED, DFT, AES, HX-PES, SRPES | 2012 |
| ( | γ′-Fe4N | no data | MgO(001) | DC magnetron sputtering of Fe in N2 | single-phase, nanosized grain structure, which transforms at 450 °C into a continuous and smooth one with RMS roughness <0.7 nm | XRD, AFM, SEM, VSM, MOMM, SQUID | 2012 |
| ( | γ′′′-FeN | no data | Al (crystallographic orientation not provided) | PLD of Fe in N2 | single-phase (no detailed description) | XRD, CEMS, DFT | 2012 |
| ( | α′′-Fe16N2 | 150 | Fe(5 nm)/GaAs(001) | sputtering of Fe in N2 + Ar, annealing in N2 | most probably multiphase (besides α′′, there is a possibility for the presence of α′; no detailed description) | XRD, XRR, VSM | 2013 |
| ( | α′′-Fe16N2 | 80–240 | MgO(001) | MBE of Fe in N2 + H2 | polycrystalline (no detailed description) | RBS, CEMS | 2014 |
| γ′′-FeN | |||||||
| ε-Fe3N | |||||||
| ( | γ′-Fe4N | 1000–10000 | Si(001) | CVD using Fe[N( | as deposited: amorphous; after annealing: columnar microstructure (no detailed description) | TEM, XPS, TOF-SIMS | 2014 |
| ( | γ′-Fe4N | 1200 | AlN(25 nm)/glass | DC magnetron sputtering of Fe in N2 + Ar | granular structure with 30 nm grains, RMS roughness 3 nm | XRR, PPMS, AFM, MFM, DFT | 2015 |
| γ′′-FeN | |||||||
| ε-Fe3N | |||||||
| ( | γ′-Fe4N | 800–1000 | glass | DC magnetron sputtering of Fe in N2 + Ar; HiPIMS in N2 + Ar | polycrystalline with crystallite sizes 10–50 nm, single-phase possible | XRD, AFM, PNR, VSM, XAS, SIMS | 2015 |
| ε-Fe3N | |||||||
| ( | γ′-Fe4N | 7.6–30.4 | MgO(001) | DC magnetron sputtering of Fe in Ar and N2 + Ar | epitaxial, single-phase | XRD, VSM | 2016 |
| ( | γ′-Fe4N | <2 (1 ML) | Cu(001) | N+ sputtering, MBE of Fe, annealing | well-ordered, single-phase | STM, STS, DFT | 2016 |
| ( | α′′-Fe16N2 | 5000 | Fe(110) foil
on Si(111) | N+ implantation (100 keV at room temperature), annealing | polycrystalline, multiphase (γ′ and FeSi present), granular structure with average grain size 25–30 nm; darker regions ∼20 nm in size, 140–200 nm apart (probably nitrogen rich regions) | XRD, TEM, VSM | 2016 |
| ( | α′′-Fe16N2 | 700–1800 | PETE | DC reactive magnetron sputtering of Fe in N2 + Ar | columnar structure with grains 4–15 nm in diameter, RMS roughness 4.7–11 nm | XRD, AFM, VNA, VSM, UV–vis, EIS, TEM | 2017 |
| γ′-Fe4N | |||||||
| ε-Fe3N | |||||||
| ζ-Fe2N | |||||||
| ( | γ′-Fe4N | 100, 200, 400 | Ru(0001) thin film | DC magnetron sputtering of Fe in N2 + Ar | the RMS roughness for a 10 nm layer was 0.15 nm (no additional information) | XRD, XPS, VSM, AFM, PCAR | 2017 |
| ( | α′-Fe8N | 530–790 | Fe(3 or 10
nm)/MgO(001), Fe(3 or 10 nm)/MgAl2O4(001) | MBE of Fe in RF N2 plasma, annealing in N2 (for α′′) | epitaxial, single-crystal, multi- or single-phase (only for α′) | RHEED, XRD, VSM | 2017 |
| α′′-Fe16N2 | |||||||
| ( | γ′-Fe4N | <2 (1 ML) | Cu(001) | N+ sputtering, MBE of Fe, annealing | epitaxial, atomically flat surface, multiphase (Fe2N and a hexagonal phase assigned to FeN) | STM, STS | 2017 |
| γ′′-FeN | |||||||
| ( | γ′-Fe4N | 2–6 (1–3 MLs) | Cu(001) | N+ sputtering, MBE of Fe, annealing | epitaxial, atomically flat surface, single-phase | STM, STS, XAS, XMCD, DFT | 2017 |
| ( | γ′-Fe4N | <2 (1 ML) | Cu(111) | N+ sputtering, MBE of Fe, annealing | epitaxial, atomically flat surface, single-phase | STM, XPS, LEED | 2018 |
| ( | γ′-Fe4N | 1800 | Si(111), MgO(5 nm)/Si(111) | DC magnetron sputtering of Fe in N2 | single-phase (no detailed description) | XRD, XPS, VSM | 2018 |
| ( | ε-Fe3- | 1300 | glass, MgO(111) | DC magnetron sputtering of Fe in N2 + Ar | epitaxial, single-phase, polycrystalline | XRR, XRD, FESEM, TEM, PPMS, DC four-point probe electric measurements | 2019 |
| ( | γ′-Fe4N | <2 (1 ML) | Cu(111) | N+ sputtering, MBE of Fe, annealing | epitaxial, atomically flat,
single-phase, reconstructed | STM, STS, LEED, XAS, XMCD | 2019 |
| ( | ε-Fe3N | 400 | SiO2(100 nm)/Si | ALD using Fe(tBu-amd)2 and N2H4 | at lower temperature (up to 265 °C): amorphous, RMS roughness <3 nm; at higher temperature (290 °C): polycrystalline, single-phase, grain structure, RMS roughness 7–30 nm | SEM, XPS, DFT, AFM (surface roughness, no images included), GIXRD (discussed, but no pattern included) | 2019 |
| ( | γ′′-FeN | 6300 | glass, polycrystalline Cu foil | RF magnetron sputtering of Fe in N2 + Ar | single-phase, polycrystalline, grain structure | XRD, SEM, EDS, TEM, XPS, cyclic voltammetry | 2019 |
| ( | γ′′-FeN | 17–500 | Si, SiO2/Si, sapphire | magnetron sputtering of Fe in N2 | single-phase, roughness 1–2 nm | XRD, XANES, CEMS, XRR, NRS | 2019 |
| ( | γ′-Fe4N | 500 | LaAlO3(100) | MBE of Fe in RF N2 plasma; DC magnetron sputtering of Fe in N2 + Ar; HiPIMS of Fe in N2 + Ar | epitaxial, single-phase; the microstructure (roughness, grain distribution, interface quality etc.) depended on the growth method | XRD, RHEED, VSM, XRR, SIMS, PNR, XAS, XMCD, MOKE | 2019 |
| ( | γ′-Fe4N | 1300 | MgO(111) | DC magnetron sputtering in N2 + Ar | depends on the growth method, epitaxial and single-phase possible | XRD, XRR (only mentioned, no pattern included), TEM, XPS, PPMS | 2019 |
| γ′′-FeN | |||||||
| γ′′′-FeN | |||||||
| ε-Fe3N | |||||||
| ( | γ′′-FeN | 200–2000 | Si(100) | reactive magnetron sputtering of Fe in N2 + Ar | polycrystalline, multiphase, grain size 2.8–9.2 nm (depending on the film thickness) | GIXRD, CEMS, VSM, NRP | 2020 |
| γ′′′-FeN | |||||||
| w-FeN | |||||||
| ( | γ′-Fe4N | <2 (1 ML) | Cu(001) | N+ sputtering, MBE of Fe, annealing | epitaxial, atomically flat surface, multiphase (Fe2N and a hexagonal phase assigned to FeN) | STM | 2020 |
| γ′′-FeN | |||||||
| ( | γ′-Fe4N | 600 | Si(100), amorphous SiO2 | DC magnetron sputtering of Fe in N2 + Ar | polycrystalline, single-phase, roughness 5.4–19 nm (depending on buffer layer) | XRD, VSM, XRR, PNR, SIMS, AFM | 2020 |
| ( | γ′′-FeN | 5–1000 | w-GaN(0001) | DC magnetron sputtering of Fe in N2 | epitaxial, single-phase | XRD (only for 1000 Å film), RHEED | 2021 |
| ( | γ′-Fe4N | 300 | MgO(100), MgO(111) | DC magnetron sputtering of Fe in N2 + Ar | epitaxial, single-phase, roughness 5–7.5 nm (depending on the substrate) | XRD, MOKE, SIMS, XRR | 2021 |
| ( | γ′′-FeN | 2–2500 | quartz (crystallographic orientation not provided) | DC magnetron sputtering of Fe in N2 | no detailed description | XANES | 2021 |
| ( | γ′′-FeN | 2430–3140 | amorphous SiO2 | DC magnetron sputtering of Fe in N2 | polycrystalline, single-phase iron nitride or Ag-doped FeN, grain size 8–31 nm(decreasing with increasing Ag content) | XRD, SEM, CEMS, SIMS, PNR | 2022 |
It is possible (but not fully confirmed) that the ε-Fe3N phase was also present in the studied sample.
The thickness of the Ag layer was not reported.
The article describes the preparation and characterization of (Fe/ζ-Fe2N) multilayers on a silicon substrate; the thickness of the iron layer was constant, while the thickness range of iron nitride is given in the table.
The authors were not able to determine whether the film represent the γ′′ or the γ′′′ phase.
The authors used Cu(100) substrate for measurements in UHV and MgO(001)/Fe4N/Cu/FeN/Cu for the studies carried out under ambient conditions.
The iron nitride was covered with a 3 nm-thick Cu capping layer.
The iron nitride was a part of a multilayer magnetic tunnel junction: Si(001)/Cu/Fe4N/Cu/Fe4N/Mg/MgO/Co42Fe38B20/Ru/Fe/Mn78Ir22/Ru.
The γ′ phase was used as a reference; the main focus of the article was on the thermal transformation from the γ′′ phase to the γ′.
The iron nitride was a part of a multilayer magnetic tunneling junction: Si(001)/[buffer layer]/Fe4N/Co40Fe40B20/Ru/Fe/Mn75Ir25 /[capping layer].
Some samples were covered with a 3 nm-thick Al capping layer.
On top of the nitrided iron film, a 1 nm-thick CaF2 capping layer was deposited.
The authors presented results obtained for two samples: Fe–N/Fe/MgO and [Fe–N/Fe]3/MgO.
The samples were covered with a 5 nm-thick Cu capping layer.
The Authors were unable to obtain confirmation regarding the crystallographic phase, however, chemical composition matched the γ′ phase.
The iron nitride films were covered with HfB2 and Pt capping layers.
The authors prepared several [Fe/Fe4N] multilayer samples with varying iron nitride film thickness.
An iron foil with a thickness of 500 nm (for preparation and characterization, it was placed on a Si(111) substrate).
Full structure: γ′-Fe4N/Ru(0001)/Ta/SiO2/Si.
The samples were covered with a thin (3–4 nm) capping layer of Al or Ti.
An additional hexagonal structure was observed at the step edges. The authors tentatively assigned it to the γ′′-FeN phase; however, the definite explanation appeared in their next article (ref (134)).
The aim of the authors was to study the γ′-Fe4N phase; however, at certain growth conditions the presence of the α, γ, ε, and ζ phases was also observed.
Both the crystallographic orientation of the silicon substrate and the oxide thickness were not specified.
As the substrates, the naturally oxidized silicon or silicon with a Cu, Ag, or CrN buffer layer (50 nm in thickness) was used. The experimental section mentions all the substrates listed; however, the results are presented only for naturally oxidized silicon.
Figure 6Schematic illustration of partial DOS of Fe4N (left) and fcc Fe (right). Reprinted with permission from ref (142). Copyright 2006 John Wiley & Sons.
Figure 7Schematic illustration of changes in the electronic structure of first- and second-neighbor iron atoms in bcc Fe induced by the introduction of a N atom. Reprinted with permission from ref (147). Copyright 1999 Elsevier.
Figure 8XPS core-level N 1s (left) and Fe 2p (middle) spectra, as well as UPS He I (right) and He II (inset) spectra of (a) nitrogen chemisorbed on Fe(001), (b) γ′′-FeN grown at 300 K on Cu(001), (c) the same iron nitride film as in (b) after annealing at 715 K, (d) γ′-Fe4N film grown on Cu(001). Reprinted with permission from ref (100). Copyright 2008 the American Physical Society.
Figure 9Temperature dependence of saturation magnetization of α′′-Fe16N2 and pure Fe films. Reprinted from ref (104) with permission. Copyright 1996 AIP Publishing.
Figure 10(Left) Mössbauer spectra recorded for a thin γ′-Fe4N film without (top curve) and with a 5 kOe magnetic field. Splitting of Fe-II atoms into Fe II-A and Fe II-B is visible in zero field but vanishes with an applied field. (Right) Polar MR plot recorded for γ′-Fe4N film using Kerr magnetometry. Reprinted figures with permission from ref (153) (left) and (125) (right). Copyright 1971 (left) and 2008 (right) by the American Physical Society.
Figure 11Top row: (left) Atomically resolved STM image (Vs = +50 mV, It = 25 nA) of Fe2N/Cu(001) with a p4gm(2 × 2) reconstruction; (middle) an image (Vs = +0.35 V, It = 470 pA) obtained for a thicker (18 Å) film with γ′-Fe4N stoichiometry (the corresponding LEED (110 eV) and XRD patterns are shown in the inset); (right) an atomically resolved STM image (Vs = +50 mV, It = 40 nA) of Fe2N/Cu(111). Bottom row: (left) A large-scale STM image (Vs = −0.1 V, It = 500 pA) showing the hexagonal reconstruction of FeN/Cu(001); (middle and right) magnetic hysteresis loops recorded using XAS and MOKE, respectively, for monolayer Fe2N (middle) and multilayer γ′-Fe4N (right) films. The (top-left, middle, right) and (bottom-left, middle) are reprinted figures with permission from ref (76) (top-left, right), (98) (top-middle), (130) (bottom-left), and (131) (bottom-middle). Copyright 2018 (top-left, right), 2007 (top-middle), 2017 (bottom-left, middle) by the American Physical Society. The (bottom-right) image is reprinted from ref (121) with the permission. Copyright 2009 AIP Publishing.
Figure 12(Left) In-plane magnetic hysteresis loops obtained for iron foils subjected to different nitrogen ion implantation fluences. (Right) Bias-voltage dependence of the tunneling magnetoresistance ratio for Fe4N/MgO/CoFeB magnetic tunnel junctions with varying γ′-Fe4N layer thickness. The left image is reprinted with permission from ref (129) under the terms of the Creative Commons CC BY license. Published by Springer Nature 2016. The right image is reprinted from ref (78) with the permission. Copyright 2009 AIP Publishing.