| Literature DB >> 35808776 |
Dana Yerimbetova1, Artem Kozlovskiy1,2,3, Valeriy Stepanenko4, Kassym Zhumadilov1.
Abstract
This work aims to evaluate the application of optical and X-ray spectroscopy methods to determine the effect of alpha-emitting radionuclides on the properties of solid-state nuclear track detectors (SSNTD) based on nitrocellulose during their detection. The proposed estimation methods are alternative methods to standard technologies, making it possible to determine the concentration of radon and its decay products without the chemical etching of film detectors and subsequent direct counting of the formed latent tracks from interacting particles. During the research, it was found that the use of optical spectroscopy and X-ray diffraction methods makes it possible to qualitatively determine the irradiation effect on changes in the properties of film detectors when α-particles with different energies pass through them. At the same time, a comparison of the data of optical spectroscopy, X-ray diffraction and the visualization of latent tracks after chemical etching made it possible to establish that a part of the registered α-particles in living quarters has an energy of less than 2.5 MeV, which is not enough to pass through the polymer film of the detector, as a result of which well-like tracks are formed. An increase in the intensity of the interference bands in the region above 700 nm and a decrease in the intensity of diffraction reflection characterized the changes in optical transmission. The penetration of the α-particles through the detecting film decreases the film's transmission capacity, forming an anisotropic change in diffraction reflections associated with a change in the film's structure and defective fractions distorting the molecular structure.Entities:
Keywords: X-ray diffraction; alpha-particle detection; nitrocellulose detector; optical spectroscopy; radon; solid-state nuclear track detector (SSNTD)
Year: 2022 PMID: 35808776 PMCID: PMC9269325 DOI: 10.3390/polym14132731
Source DB: PubMed Journal: Polymers (Basel) ISSN: 2073-4360 Impact factor: 4.967
Figure 1Transmittance change results of initial film LR-115 type 2 (the presented data were obtained with the correction for Fresnel loss, by measuring the reference spectra).
Figure 2Transmittance results of the studied samples: (a) residential premises; (b) basements.
Figure 3Surface morphology images of SSNTD films after chemical etching to visualize latent tracks.
Figure 4SEM images of side cleavages of the studied film samples: (a) sample 1; (b) sample 4; (c) sample 3; (d) schematic representation of the detection of α-particles by film detectors.
Radon volumetric activity data (the measurement data presented in the table were determined by calculating the density of latent tracks and the volumetric activity for all studied films with further determination of the average value and standard deviation).
| Sample | Premise Type | Density of Latent Tracks, Tracks/cm2 | Volumetric Activity, Bq/m3 |
|---|---|---|---|
| Sample 1 | Residential | 3409 ± 103 | 1103.6 ± 16.3 |
| Sample 2 | 3124 ± 106 | 1011.4 ± 21.4 | |
| Sample 3 | Basement | 20,300 ± 466 | 6102.69 ± 32.12 |
| Sample 4 | 1825 ± 121 | 590.84 ± 7.18 |
Figure 5X-ray diffraction patterns of the studied samples of SSNTD films placed in residential premises: (a) comparative diffraction patterns of samples after detection of α-particles; representation of X-ray diffraction patterns in survey geometry φ = 0–360°: (b) initial sample; (c) sample 2; (d) sample 1.
Figure 6X-ray diffraction patterns of the studied samples of SSNTD films placed in the basement: (a) comparative diffraction patterns of samples after detection of α-particles; representation of X-ray diffraction patterns in survey geometry φ = 0–360°: (b) initial sample; (c) sample 4; (d) sample 3.
Figure 7Examples of surface images of the detection film after chemical etching of latent tracks made using various microscopes: (a) optical microscope; (b) scanning electron microscope (differences in track diameters are clearly visible in the image).