| Literature DB >> 35804164 |
Mohammadali Shahsavari1, Amin Imani2, Andaman Setavoraphan1, Rebecca Filardo Schaller1,3, Edouard Asselin1.
Abstract
This study explores the effect of surface re-finishing on the corrosion behavior of electron beam manufactured (EBM) Ti-G5 (Ti-6Al-4V), including the novel application of an electron beam surface remelting (EBSR) technique. Specifically, the relationship between material surface roughness and corrosion resistance was examined. Surface roughness was tested in the as-printed (AP), mechanically polished (MP), and EBSR states and compared to wrought (WR) counterparts. Electrochemical measurements were performed in chloride-containing media. It was observed that surface roughness, rather than differences in the underlying microstructure, played a more significant role in the general corrosion resistance in the environment explored here. While both MP and EBSR methods reduced surface roughness and enhanced corrosion resistance, mechanical polishing has many known limitations. The EBSR process explored herein demonstrated positive preliminary results. The surface roughness (Ra) of the EBM-AP material was considerably reduced by 82%. Additionally, the measured corrosion current density in 0.6 M NaCl for the EBSR sample is 0.05 µA cm-2, five times less than the value obtained for the EBM-AP specimen (0.26 µA cm-2).Entities:
Year: 2022 PMID: 35804164 PMCID: PMC9270471 DOI: 10.1038/s41598-022-14907-2
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.996
Figure 1FE-SEM micrographs of (a) WR and (b) EBM-AP Ti-G5 alloy. The α and β phases are shown by dark and light areas, respectively. Microstructures after EBSR on (c) WR and (d) EBM samples. The parallel lines show the scan track of the electron beam during the remelting process. (e) Un-melted and partially sintered particles on the as-printed surface, (f) lack of fusion defects and bulk pores on the as-printed surface after mechanical polishing. (g) XRD patterns of the WR and EBM materials before and after EBSR treatment.
Surface roughness values for EBM and WR samples in different surface states of as-printed (AP), electron beam surface remelted (EBSR), and mechanically polished (MP).
| Surface condition | Ra (µm) |
|---|---|
| EBM as-printed | 24.83 ± 4.31 |
| EBM- electron beam surface remelted | 4.55 ± 0.79 |
| EBM- mechanically polished (1200 grit) | 0.69 ± 0.09 |
| WR- electron beam surface remelted | 3.79 ± 0.15 |
The mechanical polishing on the WR sample would result in a similar surface roughness to EBM as the same sandpaper (1200 grit) was used for both samples.
Figure 2Cross-sectional FE-SEM (a,b) and OM (c,d) images of EBM-AP (a), EBM-EBSR (b), WR-EBSR (c), and EBM-EBSR (d). The samples in (c) and (d) were etched and the insets show the SEM micrographs.
Figure 3(a) OCP and (b) PDP curves of the EBSR, EBM, and WR samples with different surface roughness values in 0.6 M NaCl solution.
Corrosion parameters obtained in 0.6 M NaCl for EBM and WR samples after different post-processing methods.
| Surface condition | EOCP at 3600 s (mVAg/AgCl) | Ecorr (mVAg/AgCl) | jcorr (µA cm−2) | βc (mV/decade) | jp (µA cm−2) |
|---|---|---|---|---|---|
| EBM-AP | − 115 | − 104 | 0.26 | 241 | 1.9 |
| EBM-EBSR | 22 | − 114 | 0.05 | 112 | 0.3 |
| WR-EBSR | 2 | − 117 | 0.11 | 124 | 0.1 |
| EBM–MP 1200 | − 268 | − 314 | 0.13 | 225 | 0.8 |
| WR–MP 1200 | − 306 | − 475 | 0.21 | 275 | 1.1 |
Chemical composition of post-EBSR samples by EDS (atomic%).
| Element (wt%) | EBM-EBSR | WR-EBSR | ||||
|---|---|---|---|---|---|---|
| Point 1 | Point 2 | Point 3 | Point 1 | Point 2 | Point 3 | |
| Ti | 85.69 | 85.32 | 85.18 | 85.19 | 85.71 | 85.48 |
| Al | 11.52 | 11.63 | 11.95 | 12.13 | 11.76 | 11.62 |
| V | 2.79 | 3.05 | 2.87 | 2.68 | 2.53 | 2.90 |
Electron beam surface remelted (EBSR) processing parameters.
| Gun pressure (mbar) | 3.57 × 10−6 |
| Chamber pressure (mbar) | 7.73 × 10−5 |
| Accelerating voltage (kV) | 90.3 |
| Accelerating voltage limit (kV) | 10 |
| Laser current (mA) | Max 55 |
| Beam current (mA) | 7.01 |
Laser current was used to heat the cathode.