Literature DB >> 35789705

Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution.

Bert Müller1, Stuart R Stock2, Ge Wang3, Jovan G Brankov4.   

Abstract

JMI guest editors introduce articles collected in the JMI Special Section on Hard X-Ray Tomography with Micrometer Resolution, a snapshot of this important niche area featured by hard x-ray tomography at the micrometer level.
© 2022 Society of Photo-Optical Instrumentation Engineers (SPIE).

Entities:  

Year:  2022        PMID： 35789705      PMCID： PMC9243520          DOI： 10.1117/1.JMI.9.3.031501

Source DB:  PubMed          Journal:  J Med Imaging (Bellingham)        ISSN： 2329-4302


  3 in total

Review 1.  The early history of x-ray diagnosis with emphasis on the contributions of physics 1895-1915.

Authors:  R F Mould
Journal:  Phys Med Biol       Date:  1995-11       Impact factor: 3.609

2.  X-ray microtomography.

Authors:  J C Elliott; S D Dover
Journal:  J Microsc       Date:  1982-05       Impact factor: 1.758
  3 in total

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