| Literature DB >> 35744305 |
Wenyi Li1, Weifu Li1,2, Zijun Qin3, Liming Tan3, Lan Huang3, Feng Liu3, Chi Xiao4.
Abstract
Ni-based superalloys are widely used to manufacture the critical hot-end components of aviation jet engines and various industrial gas turbines. The analysis of Ni-based superalloys microstructures is an important research task during the design and development of superalloys. The material microstructure information can only be understood by experts in the long history. Image segmentation and recognition are developing techniques for accelerating the microstructure analysis automatically. Although deep learning techniques have achieved satisfactory performance, they usually suffer from generalization, i.e., performing worse on a new dataset. In this paper, a deep transfer learning method which just needs a small number of labeled images is proposed to perform the microstructure recognition on γ' phase. To evaluate the effectiveness, we homely prepare two Ni-based superalloys at temperatures 900 °C and 1000 °C, and manually annotate two datasets named as W-900 and W-1000. Experimental results demonstrate that the proposed method only needs 3 and 5 labeled images to achieve state-of-the-art segmentation accuracy during the transfer from W-900 to W-1000 and the transfer from W-1000 to W-900, while enjoying the advantage of fast convergence. In addition, a simple and effective software for the Ni-based superalloys microstructure recognition on γ' phase is developed to improve the efficiency of materials experts, which will greatly facilitate the design of new Ni-base superalloys and even other multicomponent alloys.Entities:
Keywords: accelerating design; deep transfer learning; microstructure characterization; scanning electron microscop; software; superalloys
Year: 2022 PMID: 35744305 PMCID: PMC9228661 DOI: 10.3390/ma15124251
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.748
Figure 1(a) The high throughput experimental preparation process of Ni-based superalloys; (b) The acquired microstructure by SEM at temperatures 900 C and 1000 C.
Measured composition of simple W1–W7 in wt.%.
| Co | W | Mo | Cr | Al | Ti | Ta | Nb | Hf | Ni | |
|---|---|---|---|---|---|---|---|---|---|---|
| W1 | 13.0 | 3.0 | 2.9 | 12.2 | 3.03 | 3.96 | 3.1 | - | 0.21 | Bal. |
| W2 | 27.8 | 3.0 | 2.9 | 12.0 | 3.05 | 4.06 | 3.0 | - | 0.21 | Bal. |
| W3 | 13.0 | 6.1 | 2.9 | 11.8 | 3.05 | 3.92 | 3.0 | - | 0.22 | Bal. |
| W4 | 13.1 | 3.0 | 6.0 | 12.1 | 3.05 | 4.08 | 3.1 | - | 0.19 | Bal. |
| W5 | 13.0 | 2.9 | 3.0 | 12.0 | 3.07 | 6.01 | 3.0 | - | 0.19 | Bal. |
| W6 | 13.0 | 3.0 | 2.9 | 12.0 | 3.10 | 4.04 | 8.1 | - | 0.20 | Bal. |
| W7 | 13.0 | 3.0 | 3.0 | 11.9 | 2.98 | 4.12 | 3.0 | 4.0 | 0.22 | Bal. |
Figure 2The schematic flowchart of deep transfer learning method from W-900 to W-1000, wherein the U-Net architecture is employed as the basic network.
Average results of deep transfer learning (TL) and random initialization (RI).
| Samples | Method | W-900 to W-1000 | W-1000 to W-900 | ||||
|---|---|---|---|---|---|---|---|
| Accuracy | Dice | IoU | Accuracy | Dice | IoU | ||
| 3 | RI | 80.56% | 49.48% | 36.46% | 80.50% | 66.00% | 52.34% |
| TL | 92.03% | 80.68% | 69.05% | 91.76% | 75.53% | 62.73% | |
| 4 | RI | 83.05% | 60.79% | 45.46% | 82.70% | 66.44% | 52.29% |
| TL | 92.00% | 80.29% | 68.64% | 91.87% | 75.53% | 62.97% | |
| 5 | RI | 89.06% | 72.96% | 61.02% | 82.07% | 69.37% | 56.71% |
| TL | 92.09% | 80.68% | 69.24% | 91.97% | 76.87% | 64.74% | |
| 6 | RI | 87.85% | 73.88% | 60.84% | 86.31% | 71.39% | 58.76% |
| TL | 92.25% | 81.37% | 70.18% | 91.66% | 77.05% | 65.07% | |
| 7 | RI | 87.37% | 73.28% | 60.28% | 87.81% | 72.01% | 59.73% |
| TL | 92.15% | 81.37% | 70.26% | 91.90% | 77.32% | 65.36% | |
| 8 | RI | 90.57% | 79.69% | 68.61% | 89.19% | 74.89% | 63.63% |
| TL | 92.15% | 81.98% | 70.78% | 91.93% | 77.38% | 65.33% | |
Figure 3(a) The box plot of Dice-coefficient of two methods during the transfer from W-900 to W-1000; (b) The box plot during the transfer from W-1000 to W-900; (c) Visualization of recognition results; (d) The validation accuracy vs. different epochs of two methods during the transfer from W-900 to W-1000; (e) The validation accuracy during the transfer from W-1000 to W-900.
Figure 4Software interface of deep transfer learning.