| Literature DB >> 35684902 |
Jin Wang1,2, Wenzhu Ji2, Qingfu Du2, Zanyang Xing1, Xinyao Xie1, Qinghe Zhang1.
Abstract
Electrostatic probe diagnosis is the main method of plasma diagnosis. However, the traditional diagnosis theory is affected by many factors, and it is difficult to obtain accurate diagnosis results. In this study, a long short-term memory (LSTM) approach is used for plasma probe diagnosis to derive electron density (Ne) and temperature (Te) more accurately and quickly. The LSTM network uses the data collected by Langmuir probes as input to eliminate the influence of the discharge device on the diagnosis that can be applied to a variety of discharge environments and even space ionospheric diagnosis. In the high-vacuum gas discharge environment, the Langmuir probe is used to obtain current-voltage (I-V) characteristic curves under different Ne and Te. A part of the data input network is selected for training, the other part of the data is used as the test set to test the network, and the parameters are adjusted to make the network obtain better prediction results. Two indexes, namely, mean squared error (MSE) and mean absolute percentage error (MAPE), are evaluated to calculate the prediction accuracy. The results show that using LSTM to diagnose plasma can reduce the impact of probe surface contamination on the traditional diagnosis methods and can accurately diagnose the underdense plasma. In addition, compared with Te, the Ne diagnosis result output by LSTM is more accurate.Entities:
Keywords: LSTM; Langmuir probe; machine learning; plasma diagnosis
Mesh:
Year: 2022 PMID: 35684902 PMCID: PMC9185368 DOI: 10.3390/s22114281
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.847
Figure 1A representative I–V characteristic curve.
Figure 2Comparison of I-V characteristic curves collected by contaminated probe and clean probe.
The comparison of plasma parameters from Pclean and Pcont.
| Vp | Ie0 | Ne | Te | |
|---|---|---|---|---|
| Pclean-Upward | 1.0 V | 9.8014 × 10−7 A | 2.1040 × 1012 m−3 | 0.7794 eV |
| Pclean-Downward | 1.0 V | 9.6144 × 10−7 A | 2.0742 × 1012 m−3 | 0.7717 eV |
| Pcont-Upward | 0 V | 1.6280 × 10−7 A | 5.1256 × 1011 m−3 | 0.3623 eV |
| Pcont-Downward | 3.2 V | 2.4366 × 10−7 A | 5.7090 × 1011 m−3 | 0.6543 eV |
Figure 3The I–V characteristic curve without obvious saturation region.
Figure 4LSTM cell structure.
Figure 5The full flowchart of the LSTM model.
Figure 6Experimental setup.
Figure 7Comparison results of different structures.
The influence of different learning rates on the model.
| η | 0.0001 | 0.00005 | 0.00003 | 0.00001 | 0.000005 |
|---|---|---|---|---|---|
| RMSE | 0.00507 | 0.00511 | 0.00511 | 0.00582 | 0.00610 |
| MAPE | 25.61891 | 23.37818 | 11.50008 | 10.64523 | 13.30315 |
Figure 8The electron density (N) and electron temperature (T) distribution of the data set.
Figure 9The training and prediction results of the N. (a) The loss rate of the training set data; (b) The accuracy and loss of the verification set data; (c) Comparison of prediction results.
Figure 10The training and prediction results of the T. (a) The loss rate of the training set data; (b) The accuracy and loss rate of the verification set data; (c) Comparison of prediction results.
Figure 11(a) The comparison results of the N; (b) The comparison results of the T.
Comparison of errors in predicting electron density (N) and electron temperature (T) using traditional diagnostic methods and LSTM.
| 1 | 2 | 3 | 4 | 5 | 6 | 7 | |Mean| | ||
|---|---|---|---|---|---|---|---|---|---|
|
| Traditional | −55.81% | −14.28% | −29.53% | −56.03% | −41.95% | −41.98% | −42.75% | 40.33% |
| LSTM | −8.67% | −2.23% | −3.42% | −15.96% | 14.46% | −18.54% | −11.57% | 10.69% | |
|
| Traditional | 8.78% | 17.43% | 5.70% | 12.92% | 4.87% | 40.77% | 13.20% | 14.81% |
| LSTM | 1.46% | −7.20% | −9.98% | −1.80% | −0.27% | 14.54% | 0.11% | 5.05% |