| Literature DB >> 35672361 |
Hyeong Jun Kim1, Jei Gyeong Jeon1, Ju Hwan Lee1, Ju Hyeon Kim1, Junho Lee1, Gilyong Shin1, Tae June Kang2.
Abstract
In this work, tosylate-doped poly(3,4-ethylenedioxythiophene) (PEDOT:Tos) films are prepared by thermally assisted oxidative polymerization either on a hot plate or in a convection oven. The main difference between these heat treatments is the way heat is transferred (conduction or convection) during polymerization. The surface morphology and structure, doped state, chemical composition, and the changes in the physical and chemical properties of the differently heat-treated films are analyzed using various instrumental methods. The hot plate-treated films exhibit a smooth and dense surface morphology with a low root-mean-square roughness of ~ 5 nm. The films have a quinoid-prevalent thiophene structure with a high electrical conductivity of 575 S/cm. By contrast, the oven-treated films show a rough and porous morphology with a surface roughness ranging from 30 to 80 nm depending on the scanning area, which yields high absorption capacity of more than 90% in the near-infrared range. The oven-treated films show a benzenoid-prevalent structure that provides relatively low electrical conductivity of 244 ± 45 S/cm. As a demonstration of these noticeable changes, PEDOT:Tos films are examined as a photothermal conversion layer to convert light energy to thermal energy, which is converted to electrical energy using a thermoelectric device by covering the films on the device.Entities:
Year: 2022 PMID: 35672361 PMCID: PMC9174293 DOI: 10.1038/s41598-022-13510-9
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.996
Figure 1(a) and (b) are the schematics of the difference in the morphology of the PEDOT:Tos films depending on the heat transfer modes in the heat treatment of the precursor coating. (c) Optical image of the PEDOT:Tos films. The hot plate-treated film reflects an object placed around it on a smooth surface, whereas the oven-treated film does not because of its roughened surface.
Figure 2SEM images of (a) the hot plate-treated and (b) oven-treated PEDOT:Tos films. (c) The RMS surface roughness of the films with respect to the side length of the scan area. AFM images of (d) oven-treated and (e) hot plate-treated PEDOT:Tos films for the varying scan areas. (f) Thickness of the PEDOT:Tos films. (g) Transmittance and reflectance spectra and (h) the absorption spectra for the films in wavelength ranges, including visible and NIR regions.
Figure 3(a) Raman analysis of the chemical structure of the films by comparing the vibrational modes of molecules in the PEDOT chain. (b) ATR FT-IR analysis of the films and (c) XPS analysis for the chemical composition of the PEDOT:Tos films and (d) the doped state of tosylate ions into PEDOT.
Figure 4(a) Experimental procedure to fabricate the TE device with the PEDOT:Tos overlayers for photothermal conversion. Optical images of the freestanding PEDOT:Tos film on water and the prepared TE device covered with the film are shown below the figure. (b) Evaluation of the performance of photothermal conversion performance of the films by measuring an output power from the TE devices with the PEDOT:Tos overlayers.