| Literature DB >> 35661728 |
Sergejs Boroviks1,2,3, Zhan-Hong Lin2, Vladimir A Zenin1, Mario Ziegler2, Andrea Dellith2, P A D Gonçalves1, Christian Wolff1, Sergey I Bozhevolnyi1,4, Jer-Shing Huang2,5,6,7, N Asger Mortensen8,9.
Abstract
Historically, the field of plasmonics has been relying on the framework of classical electrodynamics, with the local-response approximation of material response being applied even when dealing with nanoscale metallic structures. However, when the confinement of electromagnetic radiation approaches atomic scales, mesoscopic effects are anticipated to become observable, e.g., those associated with the nonlocal electrodynamic surface response of the electron gas. Here, we investigate nonlocal effects in propagating gap surface plasmon modes in ultrathin metal-dielectric-metal planar waveguides, exploiting monocrystalline gold flakes separated by atomic-layer-deposited aluminum oxide. We use scanning near-field optical microscopy to directly access the near-field of such confined gap plasmon modes and measure their dispersion relation via their complex-valued propagation constants. We compare our experimental findings with the predictions of the generalized nonlocal optical response theory to unveil signatures of nonlocal damping, which becomes appreciable for few-nanometer-sized dielectric gaps.Entities:
Year: 2022 PMID: 35661728 PMCID: PMC9166740 DOI: 10.1038/s41467-022-30737-2
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 17.694
Fig. 1Schematic illustration of the experiment.
The red curves schematically illustrate the electric-field profile of the excitation light (bottom left) and of the propagating GSP mode (in the sample) with the group-index nGSP (corresponding to a GSP-wavelength λGSP at the free-space wavelength λ0). Insets show the parametric plot (varying the gap-size, td) of the GSP dispersion trends as the nonlocal length scale ξ ⟶ 0, while at the bottom right it is shown a close-up of the MDM waveguide comprised of the monocrystalline gold (Au) flakes separated by a thin dielectric gap formed by atomic-layer deposition of aluminum oxide (Al2O3).
Fig. 2Micrographs of the fabricated sample.
a Bright- and (b) dark-field optical images of the sample with a 3 nm Al2O3 layer before the transfer of the top flake. c Bright- and (d) dark-field optical images of the sample after the transfer of the top flake. e SEM image of the flake during intermediate fabrication step and (f) close-up image of the FIB milled coupling element. Scale bars in panels (a–d) correspond to 10 μm, in panel (e) to 2 μm and in panel (f) to 50 nm.
Fig. 3Scanning near-field optical microscopy measurements.
a Schematic illustration of the s-SNOM setup (see “Methods” for details). Pseudo-color images of (b) amplitude and (c) real-part of the detected near-field (NF) signal for the sample with 3 nm dielectric gap at λ0 = 1550 nm excitation wavelength (scale bars: 2 μm). d Amplitude of the Fourier transformed NF map along the propagation coordinate (x → k) and (e) its profile (averaged along the y-axis).
Fig. 4Analysis of the experimental and theoretical results.
a Real part (solid curves) and exponential envelopes (dashed curves) of the GSP mode profiles extracted from s-SNOM measurements for the five samples with different gap thickness (see labels). b Parametric plot of the effective-mode index nGSP (at the excitation wavelength λ0 = 1550 nm) for varying dielectric gap thickness: calculated using LRA (dashed curve), GNOR model (solid curve) and experimentally obtained data (squares with error bars that represent standard deviation of the measurement). Colors of the indicated points on the curves and experimental data points correspond to 2, 3, 5, 10, and 20 nm gap thicknesses, as in panel (a).