| Literature DB >> 35658041 |
Tianshuang Ren1, Miaocong Li1, Xikang Sun1, Lele Ju1, Yuan Liu1, Siyuan Hong1, Yanqiu Sun1, Qian Tao1, Yi Zhou2,3,4, Zhu-An Xu1,5, Yanwu Xie1,5.
Abstract
The recent discovery of superconductivity at the interfaces between KTaO3 and EuO (or LaAlO3) gives birth to the second generation of oxide interface superconductors. This superconductivity exhibits a strong dependence on the surface plane of KTaO3, in contrast to the seminal LaAlO3/SrTiO3 interface, and the superconducting transition temperature Tc is enhanced by one order of magnitude. For understanding its nature, a crucial issue arises: Is the formation of oxide interfaces indispensable for the occurrence of superconductivity? Exploiting ionic liquid (IL) gating, we are successful in achieving superconductivity at KTaO3(111) and KTaO3(110) surfaces with Tc up to 2.0 and 1.0 K, respectively. This oxide-IL interface superconductivity provides a clear evidence that the essential physics of KTaO3 interface superconductivity lies in the KTaO3 surfaces doped with electrons. Moreover, the controllability with IL technique paves the way for studying the intrinsic superconductivity in KTaO3.Entities:
Year: 2022 PMID: 35658041 PMCID: PMC9166623 DOI: 10.1126/sciadv.abn4273
Source DB: PubMed Journal: Sci Adv ISSN: 2375-2548 Impact factor: 14.957
Fig. 1.Schematic of gating KTO surfaces with IL.
(A to E) Step-by-step processes for fabricating devices. (A) Clean KTO single-crystalline substrate with flat surface. (B) Confining KTO surface to a Hall bar region by coating the other area with 200-nm-thick a-AlO layer as a hard mask. The a-AlO/KTO interface is highly insulating. (C) Depositing Ti(10 nm) and Au(50 nm) metallic layers to form gating electrodes. (D) Deposing a thin a-LAO layer on six contacting pads of the Hall bar. The deposition was performed in vacuum at room temperature. This process metallizes the underneath KTO surface and thus improves the electric contact to the central Hall bar channel when gated with IL. (E) Putting a tiny drop of IL (DEME-TFSI) on the central area as schemed. Gating configuration and electrical contacts to the device are as labeled. Before putting the IL, the device surface was cleaned by oxygen plasma to remove any residual photoresist. (F) Photo image of a typical device with bonded Al contacting wires.
Fig. 2.Transport properties of KTO surfaces gated with IL.
(A) Sheet resistance Rsheet as a function of temperature for a set (denoted by A) of typical samples with three different crystalline orientations, at VG = 4.5 V. (B) A close view of Rsheet(T) values at low temperatures. (C) Hall resistance RHall as a function of magnetic field at T = 2 K. (D) Rsheet as a function of a magnetic field applied perpendicular to the surface, measured at T = 0.5 K. (E and F) The same Rsheet(T) dependences of (111)_A and (110)_A shown in (B), plotted on a [dln(Rsheet)/dT]−2/3 scale. Solid lines indicate the scaling law for a Berezinskii-Kosterlitz-Thouless (BKT) transition. (G) Rsheet(T) for multiple gated KTO(111) samples (denoted by A, B, and C) showing resistive superconducting transitions. The VG and midpoint Tc for each sample are as labeled. The optimal Tc was observed in sample (111)_B when gated and measured in a second run (#2). Note that the process 1(D) (depositing a-LAO) was skipped in fabricating (111)_C.
Fig. 3.Features of 2D superconductor for the IL-gated KTO(111) surface.
(A) Temperature-dependent voltage-current (V-I) characteristics of the (111)_A sample at VG = 4.5 V. The channel width is 100 μm. (B) The same V-I curves on a logarithmic scale. The long dashed line corresponds to V ∝ I3 dependence and shows that 1.56 K < TBKT < 1.58 K. (C) The upper critical field μ0Hc2 versus temperature. The (squares; field data multiplied by 5 for clarity) and (circles) label the upper critical field perpendicular and parallel to the sample surface, respectively. Dashed lines are fits to the linearized Ginzburg-Landau theory.
Fig. 4.Gate voltage VG dependence of transport properties.
(A to D) (111) and (E to H) (110) surfaces. (A and E) Temperature dependence of Rsheet at different VG values. (B and F) Midpoint Tc, (C and G) sheet carrier density nsheet, and (D and H) Hall mobility μHall at different VG values.