| Literature DB >> 35557907 |
Wassila Derafa1,2, Fotios Paloukis1, Basma Mewafy1, Walid Baaziz3, Ovidiu Ersen3, Corinne Petit1, Gwenaël Corbel4, Spyridon Zafeiratos1.
Abstract
Nickel-doped ceria nanoparticles (Ni0.1Ce0.9O2-x NPs) were fabricated from Schiff-base complexes and characterized by various microscopic and spectroscopic methods. Clear evidence is provided for incorporation of nickel ions in the ceria lattice in the form of Ni3+ species which is considered as the hole trapped state of Ni2+. The Ni0.1Ce0.9O2-x NPs exhibit enhanced reducibility in H2 as compared to conventional ceria-supported Ni particles, while in O2 the dopant nickel cations are oxidized at higher valence than the supported ones. This journal is © The Royal Society of Chemistry.Entities:
Year: 2018 PMID: 35557907 PMCID: PMC9091644 DOI: 10.1039/c8ra07995a
Source DB: PubMed Journal: RSC Adv ISSN: 2046-2069 Impact factor: 3.361
Scheme 1Schematic illustration of the preparation of the Ni0.1Ce0.9O2− nanoparticles.
Fig. 1(a) XRD patterns (b) Raman spectra and (c) XPS spectra (d) Auger spectrum of Ni0.1Ce0.9O2− particles as synthesized (red) and after calcination at 400 °C in O2 (black).
Fig. 2SEM images of a Ni0.1Ce0.9O2− layer (a) fresh after drop casting the solution on a SiO2/Si wafer (b) after calcination at 400 °C on a SiO2/Si wafer and (c) after calcination at 400 °C on a Au polycrystalline foil.
Fig. 3High resolution bright field STEM image and the corresponding FFT diffraction pattern of Ni0.1Ce0.9O2− formed after calcination at 400 °C.
Cell parameters of the Ni0.1Ce0.9O2− NPs and 10%Ni/CeO2 as defined by in situ XRD, after O2 and H2 annealing at 400 °C
| Sample |
|
|
|---|---|---|
| CeO2/NiO (10 mol%) | 5.4103(1) | 5.4109(1) |
| Ni0.1Ce0.9O2− | 5.421(1) | 5.424(1) |
Fig. 4Ni 2p and Ce 3d XPS spectra of Ni0.1Ce0.9O2− NPs (a) and 10%Ni/CeO2 (b) upon treatment up to 400 °C in O2 and H2 atmospheres.
Fig. 5(a) Comparison of the Ni 2p3/2 spectra between 10% Ni/CeO2 and NiCe NPs samples recorded after calcination at 400 °C (b) deconvolution procedure of two characteristic Ce 3d XPS spectra using Ce4+ and Ce3+ line shapes derived from reference samples recorded under identical reduction conditions (400 °C in H2).
The % concentration of Ce3+ species at different gas treatments as derived by the analysis of the Ce 3d XPS spectra
| Conditions | % Ce3+ | |
|---|---|---|
| Ni0.1Ce0.9O2− | 10%Ni/CeO2 | |
| Calcined | 0 | 0 |
| 200 °C in H2 | 27 | 5 |
| 400 °C in H2 | 74 | 10 |
| 200 °C in O2 | 31 | 10 |
| 400 °C in O2 | 0 | 0 |