| Literature DB >> 35541391 |
Yingjian Yu1,2,3, Danshuo Chen1, Shaoshuai Gao1, Jian Huang1, Sujuan Hu4, Hai Yang1,2, Guojun Jin1,2.
Abstract
The surface passivation of Ge(100) and Ge(111) anodes in Ge-air batteries with different doping types and concentrations is analyzed by density function theory (DFT) calculations. Compared with Ge(111) anodes, the surface passivation is restrained on Ge(100) anodes as they have larger binding energies with GeO2 layers. Meanwhile, doping would hinder the formation of a GeO2 layer on Ge anodes, especially for p-type doping, like B. The dissimilarities of the electrostatic potential differences and projected local density of states between the p-type Ge(100)/GeO2 and Ge(111)/GeO2 also reveal the origins of their distinct performances in Ge-air batteries. Furthermore, the I-V curves show that the Ge(100)/GeO2/Ge(100) device has a higher current than the Ge(111)/GeO2/Ge(111) device. This work would help to fundamentally comprehend the different electrochemical properties of Ge-air batteries with different orientations and doping and provide guidelines for the design of Ge anodes in Ge-air batteries. This journal is © The Royal Society of Chemistry.Entities:
Year: 2019 PMID: 35541391 PMCID: PMC9076083 DOI: 10.1039/c9ra06725f
Source DB: PubMed Journal: RSC Adv ISSN: 2046-2069 Impact factor: 4.036
Fig. 1Atomic configurations of (a) Ge(100)/GeO2 and (b) Ge(111)/GeO2 interfaces; the interfaces of B-doped (c) Ge(100)/GeO2 and (d) Ge(111)/GeO2 by substituting one Ge atom in the 1st and 2nd slab with one B atom, respectively; the interfaces of N-doped (e) Ge(100)/GeO2 and (f) Ge(111)/GeO2 by substituting one Ge atom in the 1st and 2nd slab with one N atom, respectively.
The binding energies (eV) of Ge(100)/GeO2 and Ge(111)/GeO2 interfaces with different kinds of doping
| Ge(100)/GeO2 | Ge(111)/GeO2 | |||
|---|---|---|---|---|
| None | 1.61 | 0.53 | ||
| Doped | B | N | B | N |
| 1st | 5.82 | 5.39 | 5.39 | 5.38 |
| 2nd | 5.63 | 5.38 | 5.32 | 5.11 |
Fig. 2The charge density difference of B-doped (a) Ge(100)/GeO2 and (b) Ge(111)/GeO2 interfaces and N-doped in the (c) Ge(100)/GeO2 and (d) Ge(111)/GeO2 interfaces.
Fig. 3The binding energies of p-type Ge(100)/GeO2 and p-type Ge(111)/GeO2 with various doping concentrations.
Fig. 4The electrostatic potential difference near the interfaces: (a) p-type Ge(100)/GeO2 and (b) p-type Ge(111)/GeO2 interfaces with different doping concentrations. The models shown in the figure have a medium doping concentration of 1016.
Fig. 5The projected local density of states of the (a) p-type Ge(100)/GeO2 and (b) p-type Ge(111)/GeO2 with the doping concentration of 1016.
Fig. 6(a) Atomic configurations of the Ge(100)/GeO2/Ge(100) and Ge(111)/GeO2/Ge(111) devices; (b) the k-point averaged transmission spectra of Ge(100)/GeO2 and Ge(111)/GeO2 interfaces as function of energy.
Fig. 7The I–V curves of Ge(100)/GeO2 and Ge(111)/GeO2 interfaces.