| Literature DB >> 35515192 |
Irina Yu Grubova1, Maria A Surmeneva1, Roman A Surmenev1, Erik C Neyts2.
Abstract
Hydroxyapatite (HAP) is frequently used as biocompatible coating on Ti-based implants. In this context, the HAP-Ti adhesion is of crucial importance. Here, we report ab initio calculations to investigate the influence of Si incorporation into the amorphous calcium-phosphate (a-HAP) structure on the interfacial bonding mechanism between the a-HAP coating and an amorphous titanium dioxide (a-TiO2) substrate, contrasting two different density functionals: PBE-GGA, and DFT-D3, which are capable of describing the influence of the van der Waals (vdW) interactions. In particular, we discuss the effect of dispersion on the work of adhesion (W ad), equilibrium geometries, and charge density difference (CDD). We find that replacement of P by Si in a-HAP (a-Si-HAP) with the creation of OH vacancies as charge compensation results in a significant increase in the bond strength between the coating and substrate in the case of using the PBE-GGA functional. However, including the vdW interactions shows that these forces considerably contribute to the W ad. We show that the difference (W ad - W ad(vdW)) is on average more than 1.1 J m-2 and 0.5 J m-2 for a-HAP/a-TiO2 and a-Si-HAP/a-TiO2, respectively. These results reveal that including vdW interactions is essential for accurately describing the chemical bonding at the a-HAP/a-TiO2 interface. This journal is © The Royal Society of Chemistry.Entities:
Year: 2020 PMID: 35515192 PMCID: PMC9057198 DOI: 10.1039/d0ra06006b
Source DB: PubMed Journal: RSC Adv ISSN: 2046-2069 Impact factor: 4.036
Fig. 1Side view of the structural models of a-HAP/a-TiO2 (a and b) and a-Si-HAP/a-TiO2 (c and d) interfaces before relaxation for stacking I (a and c) and II (b and d). Red spheres, O; blue, Ca; white, H; violet, P; dark blue, Si; orange, Ti.
Work of adhesion calculated with various exchange-correlation functional
| Functional |
| |||
|---|---|---|---|---|
| System | a-HAP/a-TiO2 | a-Si-HAP/a-TiO2 | ||
| Stacking position | I | II | I | II |
|
| ||||
| PBE | −0.690 | −2.030 | −1.370 | −2.855 |
| DFT-D3 | −1.740 | −0.930 | −0.870 | −2.315 |
Charge density difference (CDD) for the a-HAP/a-TiO2 interface and the a-Si-HAP/a-TiO2 interface. The isosurface value is set to ±0.002 e Å−3. Yellow regions show electron depletion, and cyan regions represent electron accumulation. Interfacial bonding is shown as black dashed ovals
| a-HAP/a-TiO2 | a-Si-HAP/a-TiO2 | ||
|---|---|---|---|
| Stacking position I | PBE |
|
|
| DFT-D3 |
|
| |
| Stacking position II | PBE |
|
|
| DFT-D3 |
|
|