| Literature DB >> 35492079 |
Hai Hung Nguyen1,2, Hanh Kieu Thi Ta1,2,3, Sungkyun Park4, Thang Bach Phan2,3, Ngoc Kim Pham1,2,3.
Abstract
In this study, the memory device of iron oxide (IO) nanoparticles (NPs) embedded in polyvinyl alcohol (PVA) demonstrates the bipolar resistive switching characteristics under an external electric field. The phase and magnetic properties of iron oxide nanoparticles change corresponding to its resistive states. At the high resistance state (HRS) of device, iron oxide nanoparticles are primarily in Fe2O3 phase and the ferromagnetism behavior is observed. In contrast, the iron oxide nanoparticles clustered by the bridging oxygen vacancies lead to mainly Fe3O4 phase and no hysteresis magnetic curve is observed at the low resistance state (LRS) of device. The results reveal that oxygen vacancies/ions in nanoparticles notably influence the resistance and magnetic behavior of nanocomposite thin films. Our study indicated that the magnetic NPs is high potential of multi-dimensional storage fields. This journal is © The Royal Society of Chemistry.Entities:
Year: 2020 PMID: 35492079 PMCID: PMC9051151 DOI: 10.1039/c9ra10101b
Source DB: PubMed Journal: RSC Adv ISSN: 2046-2069 Impact factor: 4.036
Fig. 1Schematic diagram of the FTO/nanocomposite/Ag memory fabrication process.
Fig. 2Structure and morphology of the IO NPs: XRD (a), survey XPS spectra (b), and O 1s (c) and Fe 2p (d) core-level X-ray photoelectron spectra, TEM (e) and HRTEM (f) images.
Fig. 3The bipolar resistive switching of memory devices: (a) current–voltage (I–V) characteristics, (b) endurance, (c) cumulative probability of LRS and HRS and (d) percentage of operation voltage.
Fig. 4Photoluminescence spectrum of the iron metal oxide NPs (a) and schematic of the energy-band structure of the NP systems (b).
Fig. 5Magnetization hysteresis curves of the iron oxide NPs (a) and hybrid nanocomposite thin films at the LRS and HRS (b) corresponding to bipolar bi-stable RS at 300 K. The diamagnetic contribution from the sample holder and FTO substrate was subtracted.
Fig. 6Mechanisms of the bipolar resistive switching effect of memory devices.