| Literature DB >> 35480835 |
Chuan Zhou1,2, Shouxin Zhang1,2, Hongjie Pan2, Guang Yang2, Lingyun Wang2, Cheng-An Tao3, Heguo Li2.
Abstract
The potential threat that has originated from chemical warfare agents (CWAs) has promoted the development of advanced materials to enhance the protection of civilian and military personnel. Zr-based metal-organic frameworks (Zr-MOFs) have recently been demonstrated as excellent catalysts for decomposing CWAs, but challenges of integrating the microcrystalline powders of Zr-MOFs into monoliths still remain. Herein, we report hierarchically porous monolithic UiO-66-X xerogels for the destruction of CWAs. We found that the UiO-66-NH2 xerogel with a larger pore size and a higher surface area than the UiO-66-NH2 powder possessed better degradability of 2-chloroethyl ethyl sulfide (2-CEES), which is a sulfur mustard simulant. These UiO-66-X xerogels exhibit outstanding performance for decomposing CWAs. The half-lives of vesicant agent sulfur mustard (HD) and nerve agent O-ethyl S-[2-(diisopropylamino)ethyl] methylphosphonothioate (VX) are as short as 14.4 min and 1.5 min, respectively. This work is, to the best of our knowledge, the first report on macroscopic monolithic UiO-66-X xerogels for ultrafast decomposition of CWAs. This journal is © The Royal Society of Chemistry.Entities:
Year: 2021 PMID: 35480835 PMCID: PMC9034225 DOI: 10.1039/d1ra01703a
Source DB: PubMed Journal: RSC Adv ISSN: 2046-2069 Impact factor: 4.036
Fig. 1Schematic of the synthesis of the UiO-66 xerogel.
Fig. 2Characterization of the xerogels. (a) XRD patterns; (b) TGA curves; (c) N2 adsorption–desorption isotherms; (d) NLDFT pore size distributions; (e) BJH pore size distributions.
Fig. 3Electron microscopy (top: low magnification; down: high magnification) images for the UiO-66-X xerogels. TEM images of the UiO-66 xerogel (a and b) and UiO-66-NH2 xerogel (c and d); SEM images of the UiO-66 xerogel (e and f) and UiO-66-NH2 (g and h) xerogel.
Fig. 4Degradation of 2-CEES on the UiO-66-NH2 xerogel and on the UiO-66-NH2 powder.
Fig. 5Degradation of HD on the UiO-66 xerogel and on the UiO-66-NH2 xerogel.
Fig. 6Degradation of VX on the UiO-66 xerogel and on the UiO-66-NH2 xerogel.