| Literature DB >> 35480798 |
Jaroslav Charvot1, Raul Zazpe2,3, Richard Krumpolec4, Jhonatan Rodriguez-Pereira2,3, David Pavliňák4, Daniel Pokorný1, Milan Klikar1, Veronika Jelínková5, Jan M Macak2,3, Filip Bureš1,5.
Abstract
The currently limited portfolio of volatile organoselenium compounds used for atomic layer deposition (ALD) has been extended by designing and preparing a series of four-, five- and six-membered cyclic silylselenides. Their fundamental properties were tailored by alternating the ring size, the number of embedded Se atoms and the used peripheral alkyl chains. In contrast to former preparations based on formation of sodium or lithium selenides, the newly developed synthetic method utilizes a direct and easy reaction of elemental selenium with chlorosilanes. Novel 2,2,4,4-tetraisopropyl-1,3,2,4-diselenadisiletane, which features good trade-off between chemical/thermal stability and reactivity, has been successfully used for gas-to-solid phase reaction with MoCl5 affording MoSe2. A thorough characterization of the as-deposited 2D MoSe2 flakes revealed its out-of-plane orientation and high purity. Hence, the developed four-membered cyclic silylselenide turned out to be well-suited Se-precursor for ALD of MoSe2. This journal is © The Royal Society of Chemistry.Entities:
Year: 2021 PMID: 35480798 PMCID: PMC9034216 DOI: 10.1039/d0ra10239c
Source DB: PubMed Journal: RSC Adv ISSN: 2046-2069 Impact factor: 4.036
Scheme 1Reaction pathway towards cyclic silylselenides.
Fig. 1TGA (top) and DSC (bottom) records of 4 (green), 5 (black), 6 (red) and 7 (blue).
Fundamental thermal properties of studied cyclic selenides 4–7
| Comp. |
|
|
|
|---|---|---|---|
| 4 | −62 | −21 | +150 to +210 |
| 5 | −64/0 | −63/+2 | +160 to +265 |
| 6 | +3 | +32 | +220 to +285 |
| 7 | +157 | +170 | +250 to +315 |
Temperature of crystallization.
Temperature of melting.
Range of evaporation.
Fig. 2SEM top images at two different magnifications of the as-deposited ALD MoSe2 at 300 °C upon 800 cycles (800 ms Se dose) on different substrates. The as-deposited MoSe2 shows 2D flaky nanosheets morphology mainly out-of-plane oriented.
Fig. 3XRD patterns of the as-deposited ALD MoSe2 on different substrates upon 800 ALD cycles (800 ms Se dose). The plane (002) revealed the out-of-plane orientation of the as-deposited ALD MoSe2 at 300 °C onTianium foil (top), silicon wafer (middle) and glass (down).
Fig. 4Raman spectra obtained from (top) MoSe2 powder and as-deposited ALD MoSe2 on titanium foil (middle) and glass (down) at 300 °C upon 800 ALD cycles (800 ms Se dose).
Fig. 5XPS high-resolution spectra of Mo 3d (left) and Se 3d (right) corresponding to as-deposited ALD MoSe2 upon 800 ALD cycles at 300 °C (800 ms Se dose).