Yu-Hsiang Hsieh1, Yung-Cheng Cheng1, Te-Yuan Chung1. 1. Department of Optics and Photonics, National Central University, No. 300 Chungda Rd., Chungli District, Taoyuan City, Taiwan 32001.
Abstract
PQ/PMMA photopolymer films fabricated by solvent casting are realized using tetrahydrofuran (THF) as the solvent. The corresponding photochemical reaction model is established with material parameters numerically studied based on 57 samples recorded with a 532 nm laser. The fabrication and the recording time are noticeably reduced. A 2-fold increase in the average refractive index variation is achieved compared with the two-step thermal polymerization method with the same PQ initial concentration.
PQ/PMMA photopolymer films fabricated by solvent casting are realized using tetrahydrofuran (THF) as the solvent. The corresponding photochemical reaction model is established with material parameters numerically studied based on 57 samples recorded with a 532 nm laser. The fabrication and the recording time are noticeably reduced. A 2-fold increase in the average refractive index variation is achieved compared with the two-step thermal polymerization method with the same PQ initial concentration.
PQ (9,10-phenanthrenequinone)-doped
PMMA (polymethyl methacrylate),
PQ/PMMA, was first reported by Steckman et al. in 1998[1] as the easy-to-make holographic recording material with
low shrinkage and low cost.[1−7] In 2000, Lin et al. developed the method of two-step thermal polymerization
and fabricated the bulk material of PQ/PMMA with large dimensions.[2] In 2008, Luo et. al exposed PQ/PMMA to a periodic
light field to make a transmission volume Bragg grating (VBG) of 90%
diffraction efficiency for a spectral-spatial imaging filter.[8] In 2014, a reflective PQ/PMMA VBG serving as
the laser mirror of a 976 nm tapered amplifier successfully achieved
a high-power single-mode laser.[9] In 2011,
Liu et al. proposed the photochemical reaction mechanisms and model
of the recording process of PQ/PMMA. The corresponding rate equations
were established.[10] In 2016, Shih et al.
simplified the model by assuming that MMA monomers are abundant and
the change of MMA concentration can be neglected during the recording
process.[11]However, the previous
models for the two-step thermal polymerization
method requiring the assumption of a constant concentration of residual
MMA monomers throughout the recording process might be inadequate
to estimate the actual amount of the photoproduct. Also, the time-consuming
fabrication process of the two-step thermal polymerization method
usually takes up to 36 h before the sample can be recorded.This work utilizes the solvent casting method frequently adopted
in fabricating organic semiconductor thin films[12] for PQ/PMMA fabrication. Dissolving ready-made PMMA and
PQ with tetrahydrofuran (THF), practically no MMA monomers are left
in the sample. The corresponding photochemical reaction model and
the reaction rate and diffusion equations are proposed. A series of
simulations and experiments were performed to evaluate the unknown
material parameters of different fabrication and recording conditions.
Modeling
The photochemical reaction model utilizing
differential equations
to evaluate molecular concentrations as a function of space and time
describes the dynamic behavior of PQ molecules excited by photons,
the diffusion through the PMMA matrix, and the reactions with PMMA
molecules. By applying the Lorentz–Lorenz formulation, the
refractive index distribution can be evaluated with the knowledge
of molecular concentrations. With a periodic recording pattern, the
diffraction efficiency can then be obtained by the coupled-wave theory.
Reaction Rate and Diffusion Equations
PQ molecules
can be excited by blue-green photons, and the corresponding
reaction[10] can be written aswhere hν represents
the absorbed photon, kPQ indicates the
excitation rate of PQ to 1PQ*, and k is the transfer rate of 1PQ* to 3PQ*. kPQ can be expressed aswhere σPQ is the effective
absorption cross section of PQ in the PMMA matrix. I and ν are the intensity and frequency of the recording light,
respectively. The singlet state 1PQ* promptly turns into
the triplet state 3PQ* that has an extremely long lifetime;
therefore, 1PQ* can be neglected in the reaction rate and
diffusion equations. 3PQ* can react with a hydrogen atom
on a PMMA chain and attaches to the chain at the same site.[10] The reactions are described bywhere k and k are the
corresponding reaction rates, R represents the rest of the PMMA chain,
and HPQR is known as the PQ/PMMA molecule. The second reaction happens
much faster than the first one;[10] therefore, eqs and 4 can be reduced toNote that 3PQ* molecules
travel freely through the openings inside the PMMA matrix; therefore,
only the hydrogen atoms exposed to the void of the PMMA matrix that
can make contact with 3PQ* are able to participate in the
reactions. As a result, PMMA in eq will be referred to as react-able hydrogen, Hreact, in the following paragraphs. Also, the large molecular
weights of PMMA and PQ/PMMA, which are more than a million, along
with the tangled PMMA chains make the diffusion of PMMA and PQ/PMMA
negligible. Therefore, the reaction rate and diffusion equations can
be written by simplifying the model in ref (10) aswhere t is the time, x stands for the x-coordinate of the space,
square parentheses represent the molarity of each kind of molecule
enclosed, and D is the diffusion coefficient. With
the above equations, the numerical method can be applied to model
the dynamic spatial behaviors of the chemical reactions.
Refractive Index Variation and Diffraction
Efficiency
The refractive indices of PQ, PMMA, and PQ/PMMA
are 1.701, 1.493, and 1.497, respectively. With the above photochemical
reactions, the exposed part of PQ/PMMA can lead to localized refractive
index reduction.[2,10,11,13,14] Therefore,
the periodic refractive index variation within PQ/PMMA can be achieved
by the two-beam interference recording scheme.PQ, 3PQ*, and PQ/PMMA are the chemical compounds responsible for the refractive
index distribution in this system. With the initial chemical concentrations
and the recording intensity distribution, the reaction rate and diffusion
equations give the spatial distributions of the chemical compounds
at any given time. Similar to ref (11), the first-order Fourier coefficients of the
chemical compound concentrations and Lorentz–Lorenz formulation[15] are applied. The overall refractive index variation
of the first Fourier order can be written aswhere γ is the proportionality constant
of each chemical compound concentration and the corresponding contribution
to the local refractive index of PQ/PMMA. A represents
the first-order Fourier coefficients of each chemical compound concentration.
With Δn1(t), the
diffraction efficiency, η(t), can be obtained
by the coupled-wave theory.[16]
Simulations
Material and Recording
Parameters
The simulation parameters fall into two categories,
the material
parameters and the recording parameters. Table lists the material parameters. The lower
case after the square parentheses indicates
the initial concentration of the corresponding molecules; n is the average refractive index of PQ/PMMA; [PQ] and the grating thickness d are
set to match the experimental conditions that will be discussed later;
σPQ and DPQ are set to
the values in accordance with refs (11, 14, 17); and D, [Hreact], k, and γ cannot
be obtained directly and will be determined by experimental results.
Table 1
Material Parameters
parameter
value (unit)
parameter
value (unit)
[PQ]i
5.61 × 10–5 mol/cm3
[Hreact]i
1 × 10–4 mol/cm3
d
120 μm
ki
20 cm3/(mol·s)
σPQ
7.5 × 10–21 cm2
γPQ
14 cm3/mol
DPQ
1.24 × 10–18 m2/s
γ3PQ*
16 cm3/mol
D3PQ*
1.24 × 10–18 m2/s
γPQ/PMMA
37 cm3/mol
n
1.493
The recording parameters
include the wavelength λ0, the average intensity I0 of the light
source, the angle between the two recording beams θ, and the exposure time tex. Note that diffusion is a slow process; therefore, the simulation
time is much longer than tex to reach
equilibrium. The values listed in Table are based on the experimental configurations.
The recorded grating period in the sample is then determined to be
251.96 nm.
Table 2
Recording Parameters
parameter
value (unit)
I0
1.6 W/cm2
λ0
532 nm
θr
90°
tex
∼50 s
Dynamic Behaviors of Molecular
Concentrations
and Refractive Index Variations
Using the RK4 (Runge–Kutta)
method, the time development of the reaction and diffusion equations
can be evaluated. The temporal and spatial distributions of [PQ],
[3PQ*], and [PQ/PMMA] with tex = 50 s are shown in Figure . The corresponding first-order Fourier coefficients of these
molecular concentrations as a function of t can be
calculated, as shown in Figure a. Δn1(t), shown in Figure b, and η(t) can then be obtained by means
of the Lorentz–Lorenz formulation and the coupled-wave theory.
Figure 1
Simulation
of the time-varying (a) [PQ], (b) [3PQ*],
and (c) [PQ/PMMA] concentration distributions of tex = 50 s recording.
Figure 2
(a) First-order
Fourier coefficient of each chemical compound concentration
distribution and (b) Δn1(t) with tex = 50 s recording.
Simulation
of the time-varying (a) [PQ], (b) [3PQ*],
and (c) [PQ/PMMA] concentration distributions of tex = 50 s recording.(a) First-order
Fourier coefficient of each chemical compound concentration
distribution and (b) Δn1(t) with tex = 50 s recording.The diffusion of PQ and 3PQ* and the
reaction of 3PQ* and Hreact are responsible
for the development
of Δn1 after the exposure stops.
Δn is defined
as the final value of Δn1 when diffusion
and all reactions cease. By varying tex, Δnf can be obtained, as shown
in Figure . The peak
of Δnf located at about tex = 40 s is marked by the dashed line in the
inset of Figure .
When tex is less than 40 s, there are
not enough PQ molecules that can be excited to form 3PQ*,
which leads to a smaller number of PQ/PMMA as well as a lower Δnf. On the other hand, when tex is over 40 s, the first-order Fourier coefficient of
[PQ/PMMA] gradually becomes smaller as discussed in ref (12) and results in a lower
Δnf. To ensure that the sample reaches
the maximum diffraction efficiency, tex is chosen to be 60 s in the following simulations as well as the
experiments. With the given laser intensity of 1.6 W/cm2, the exposure fluence is 96 J/cm2.
Figure 3
Δnf as a function of tex.
Δnf as a function of tex.
Analysis of the Material
Parameters, k and [Hreact]
In practice, higher
Δn1 and Δn are preferred. The influences of k and [Hreact] to Δn1 can be
simulated, as shown in Figure . Since [3PQ*] distribution
matches the recording light pattern and higher k allows 3PQ* to react locally,
[PQ/PMMA] matches better with the recording light pattern with higher k, which gives higher Δn, as shown in Figure a. On the other hand, higher
[Hreact] increases the opportunity
of 3PQ* being intercepted by Hreact during diffusion.
Consequently, [PQ/PMMA] distribution also matches better with the
recording light pattern. Higher Δn is thus achievable, as indicated in Figure b.
Figure 4
Δn1 of 60 s recording: (a) k varies from 5 to 60 cm3/(mol·s)
and [Hreact] is set to 1 ×
10–4 mol/cm3. (b) [Hreact] varies from
0.2 × 10–4 to 1 × 10–4 mol/cm3 and k is set to 60 cm3/(mol·s). The insets are the
final Δn1 versus k and [Hreact], respectively.
Δn1 of 60 s recording: (a) k varies from 5 to 60 cm3/(mol·s)
and [Hreact] is set to 1 ×
10–4 mol/cm3. (b) [Hreact] varies from
0.2 × 10–4 to 1 × 10–4 mol/cm3 and k is set to 60 cm3/(mol·s). The insets are the
final Δn1 versus k and [Hreact], respectively.
Fabrication and Recording Configurations
Fabrication of a PQ/PMMA Film by Solvent Casting
The
method of solvent casting involves three major procedures that
include preparation of the casting solution, coating process, and
evaporation. The casting solution consisted of 23.02 wt% PMMA powder
(Merck & Co., average molecular weight of 120,000) as the host
material and 0.23 wt% PQ (Tokyo Chemical Industry) as the additive
that were dissolved by 76.75 wt% tetrahydrofuran (THF, Chung Yuan
Chemicals). The mixture was stirred at a rate of 180 rpm at 45 °C
for 120 min using a heating magnetic stirrer (Thermo Fisher Scientific,
SP131325Q). The doctor blade coating method[12] was utilized to fabricate the film. About 2.5 mL of casting solution
was spread by a doctor blade coater (KTQ-II) to form a 400 μm
wet film on a BK7 substrate. The wet film was then placed inside a
temperature-controlled environment for a 90 min evaporation process.
The evaporation temperatures, Tevap, were
chosen to be 60, 40, 25, or 5 °C, which may affect the morphology
and characteristics of the film.[18−21] As shown in Figure , a solid film formed after
THF evaporated, and the thickness of the film was measured to be 120
± 10 μm. The absorption at the recording wavelength is
about 4%. Regardless of the Tevap, the
films showed excellent transparency with no noticeable scattering
or surface roughness. The PQ/PMMA solid film and the BK7 substrate
will be referred to as the sample in the following paragraphs.
Figure 5
PQ/PMMA solid
film after the evaporation process.
PQ/PMMA solid
film after the evaporation process.The entire fabrication process can be completed within 4 h, which
is greatly reduced compared to the method of two-step thermal polymerization.[2] Furthermore, ready-made PMMA powder is used instead,
and the difficulty of estimating the residual MMA monomer concentration
is thus avoided.
Two-Beam Interference Recording
Configuration
The recording configuration is shown in Figure . A single longitudinal
mode 532 nm laser
(Coherent, Verdi) was chosen to be the recording light source. A Faraday
isolator (Optics for Research, IO-5-532-LP) was used to prevent optical
feedback. The polarization was then adjusted by a half-wave plate
to TE polarization with respect to the surface of the sample. To increase
the spatial coherence, a spatial filter composed of a 20 × objective
(Thorlabs, RMS20X) and a 10 μm pinhole (Thorlabs, P10H) was
mounted before a collimation lens (Thorlabs, C330TME). The laser beam
was split with a 50:50 beamsplitter (Thorlabs, BS013). M5 and M6 redirect
the two recording beams to the sample. The angle between the two recording
beams was set to be 90°. The sample was clamped by two BK7 right-angle
prisms (Thorlabs, PS912) whose refractive indices are 1.52. Silicone
oil (Kuen Min Tech) of refractive index 1.52 was applied to both surfaces
of the sample for refractive index matching.
Figure 6
Two-beam interference
recording configuration.
Two-beam interference
recording configuration.The diffraction efficiency
of the sample during the recording process
was monitored and measured by blocking one of the recording beams
with an optical shutter (Thorlabs, SHB1T), as shown in Figure . The other recording beam
was partly diffracted and partly transmitted through the sample with
the corresponding powers of P1 and P2 measured
using a power meter (Ophir, PD300-3W). The diffraction efficiency
η can thus be obtained by
Figure 7
Measurement
of the diffraction efficiency of the sample during
the recording process.
Measurement
of the diffraction efficiency of the sample during
the recording process.
Experimental
Results
Parameters Fitted by the Photochemical Reaction
Model
By measuring η every 30 s during a recording/developing
process, Δn1 can also be obtained
by the coupled-wave theory. The data of Δn1(t) can then be fitted by the reaction rate
and diffusion equations, thereby determining the unknown material
parameters, namely, D,
[Hreact], k, and γ.The Δn1(t) of the three PQ/PMMA samples
fabricated at T =
40 °C with tex chosen to be 60 s
was calculated and plotted in Figure . D, γPQ, γ, and γPQ/PMMA of sample 1 were obtained by fitting eqs –9 as 3.2 ×
10–18 m2/s, 14.1, 16.8, and 37.5 cm3/mol, respectively. D and γ are both assumed to be identical under the same fabrication
and recording conditions. [Hreact] and k listed
in Table are the
parameters distinguishing different samples. With these values, the
fitted Δn1(t) curves
agree well with the experimental data of all three samples, as shown
in Figure . Therefore,
under a constant Tevap, the assumption
of identical values of D and γ under the same fabrication and recording conditions
is credible.
Figure 8
Δn1(t) and the
corresponding fitting curves of the three identical PQ/PMMA samples
fabricated at Tevap = 40 °C with tex chosen to be 60 s.
Table 3
Parameter Values of the Fitting Curves
of Samples 1, 2, and 3
sample
[Hreact]i (mol/cm3)
ki (cm3/(mol·s))
sample
1
6.0 × 10–5
93.9
sample 2
6.7 × 10–5
56.6
sample 3
6.3 × 10–5
35.7
Δn1(t) and the
corresponding fitting curves of the three identical PQ/PMMA samples
fabricated at Tevap = 40 °C with tex chosen to be 60 s.
Effects of the Evaporation Temperature, Tevap
The effects of Tevap are analyzed similarly. Totally 57 samples are fabricated
at Tevap = 60, 40, 25, or 5 °C with
the identical recording conditions. Δn1(t) is then obtained and fitted to estimate
the material parameters. The recorded samples showed similar weak
bleaching at the recording spots, which have no significant difference
among different Tevap values.The
average D is plotted against Tevap in Figure . The trend shows that a lower evaporation temperature
leads to a higher value of D. Tevap determines the solvent evaporation
rate and the kinetic energy of PMMA, which in turn affects the final
morphology of the PMMA matrix. A higher value of D implies that the matrix contains more
openings that allow easier diffusion of PQ and 3PQ* molecules.
Therefore, according to Figure , lower Tevap may tend to result
in a more porous PMMA matrix due to the lack of stretching of PMMA
molecules during the process of evaporation.
Figure 9
Average D of a total
of 57 PQ/PMMA samples fabricated at different Tevap values.
Average D of a total
of 57 PQ/PMMA samples fabricated at different Tevap values.The calculated k versus
[Hreact] and [Hreact] versus Tevap of all 57 samples are shown in Figure a,b, respectively. Most of the samples have
[Hreact] lower than 1 ×
10–4 mol/cm3. However, there are samples
with [Hreact] noticeably higher
and can even reach 5.3 × 10–4 mol/cm3. On the other hand, k does not show a clear trend and distributes from 3 to 300 cm3/(mol·s). The data showing higher [Hreact] only appear for Tevap = 25 and 40 °C. Though the fabrication and recording conditions
are identical, the data of Tevap = 25
°C fall into two distinct groups on this plot. About 37% of the
samples have high [Hreact] but with low k, whereas
the other 63% take on lower [Hreact] with relatively high k. On the other hand, no conspicuous groups can be found among
the data of Tevap = 40 °C. Unlike
the previous cases, the data of Tevap =
5 and 60 °C are confined to relatively small regions with low
[Hreact]. While [Hreact] almost remains fixed, k varies largely.
Figure 10
(a) k and [Hreact] and (b) average [Hreact] of a total of 57 PQ/PMMA
samples fabricated at different Tevap values.
(a) k and [Hreact] and (b) average [Hreact] of a total of 57 PQ/PMMA
samples fabricated at different Tevap values.From the grating fabrication perspective, reaching
the highest
possible Δn and
η is the goal. As discussed in Section , both higher k and [Hreact] allow reaching higher Δn and η. With Tevap = 5 and
60 °C, the samples have low [Hreact] and result in low Δn. Though with a minority of the samples fabricated at Tevap = 25 °C that have unusually high [Hreact], the fabrication at Tevap = 40 °C gives the largest average
[Hreact] and Δn among the four evaporation
temperatures. The average Δnf of
the VBG fabricated at Tevap = 40 °C
with the previously mentioned recording conditions reached 3.6 ×
10–4. With the same [PQ], this value is more than 2 times higher than those of the samples
fabricated by the method of two-step thermal polymerization in ref (14), which reached only 1.5
× 10–4.At higher Tevap, the PMMA matrix may
have a chance to settle with fewer pores for PQ to move and less react-able
H is exposed. At lower Tevap, PQ molecules
may tend to cluster. Therefore, PQ may be harder to react. However,
the detailed mechanism requires further investigation.
Conclusions
Solvent-cast PQ/PMMA photopolymer films
using THF as the solvent
are realized with the benefits of fast fabrication, efficient recording,
and high refractive index variation. The corresponding photochemical
reaction model and the reaction and diffusion equations recorded with
a 532 nm laser are established. The fabrication and recording processes
can be completed within 4 h. The material parameters D, [Hreact], k, and γ
are numerically obtained and analyzed based on 57 samples. With a
40 °C evaporation temperature, 96 J/cm2 recording
fluence, and 60 s exposure time, the average Δnf of such PQ/PMMA films can reach 3.6 × 10–4.
Authors: B G Manukhin; S A Chivilikhin; N V Andreeva; T B Kuzmina; D A Materikina; O V Andreeva Journal: Appl Opt Date: 2018-11-01 Impact factor: 1.980