| Literature DB >> 35371497 |
Dameli Assalauova1, Young Yong Kim1, Sergey Bobkov2, Ruslan Khubbutdinov1,3, Max Rose1, Roberto Alvarez4,5, Jakob Andreasson6, Eugeniu Balaur7, Alice Contreras8,9, Hasan DeMirci10,11, Luca Gelisio12, Janos Hajdu6,13, Mark S Hunter14, Ruslan P Kurta15, Haoyuan Li16,14, Matthew McFadden9, Reza Nazari4,17, Peter Schwander18, Anton Teslyuk2,19, Peter Walter14, P Lourdu Xavier12,14,20, Chun Hong Yoon14, Sahba Zaare4,14, Viacheslav A Ilyin2,19, Richard A Kirian4, Brenda G Hogue8,9,21, Andrew Aquila14, Ivan A Vartanyants1,3.
Abstract
[This corrects the article DOI: 10.1107/S2052252520012798.]. © Assalauova et al. 2022.Entities:
Keywords: XFEL; coherent X-ray diffractive imaging (CXDI); free-electron lasers; single particles
Year: 2022 PMID: 35371497 PMCID: PMC8895016 DOI: 10.1107/S2052252522000501
Source DB: PubMed Journal: IUCrJ ISSN: 2052-2525 Impact factor: 4.769
Figure 3Classification of diffraction patterns by EM clustering. (c) Averaged PSD functions for EM-based single-hit selection containing 1085 patterns (blue line) and for manual selection containing 1393 patterns (orange line).