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Literature DB >> 35351854

Correction: Deep learning in optical metrology: a review.

Chao Zuo^1,2, Jiaming Qian^3,4, Shijie Feng^3,4, Wei Yin^3,4, Yixuan Li^3,4, Pengfei Fan^3,4,5, Jing Han⁴, Kemao Qian⁶, Qian Chen⁷.

Abstract

Entities: Chemical

Year: 2022 PMID： 35351854 PMCID： PMC8964672 DOI： 10.1038/s41377-022-00757-0

Source DB: PubMed Journal: Light Sci Appl ISSN： 2047-7538 Impact factor: 17.782

× No keyword cloud information.

Correction to: Light: Science & Applications 10.1038/s41377-022-00714-x, published online 23 February 2022 Following publication of this article[1], it is noticed that some brackets are missing in the mathematical expressions in Fig. 1. Updated Fig. 1 is provided in this Correction. The original article has been updated.

1 in total

Review 1. Deep learning in optical metrology: a review.

Authors: Chao Zuo; Jiaming Qian; Shijie Feng; Wei Yin; Yixuan Li; Pengfei Fan; Jing Han; Kemao Qian; Qian Chen
Journal: Light Sci Appl Date: 2022-02-23 Impact factor: 20.257

1 in total