| Literature DB >> 35336309 |
Wenjuan Mei1, Zhen Liu1, Lei Tang2, Yuanzhang Su1,3.
Abstract
Resulting from the short production cycle and rapid design technology development, traditional prognostic and health management (PHM) approaches become impractical and fail to match the requirement of systems with structural and functional complexity. Among all PHM designs, testability design and maintainability design face critical difficulties. First, testability design requires much labor and knowledge preparation, and wastes the sensor recording information. Second, maintainability design suffers bad influences by improper testability design. We proposed a test strategy optimization based on soft-sensing and ensemble belief measurements to overcome these problems. Instead of serial PHM design, the proposed method constructs a closed loop between testability and maintenance to generate an adaptive fault diagnostic tree with soft-sensor nodes. The diagnostic tree generated ensures high efficiency and flexibility, taking advantage of extreme learning machine (ELM) and affinity propagation (AP). The experiment results show that our method receives the highest performance with state-of-art methods. Additionally, the proposed method enlarges the diagnostic flexibility and saves much human labor on testability design.Entities:
Keywords: extreme learning machine; prognostic and health management; soft sensors
Mesh:
Year: 2022 PMID: 35336309 PMCID: PMC8948794 DOI: 10.3390/s22062138
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576
Figure 1Element and the corresponding relationship of PHM engineering.
Figure 2Traditional framework of testability and maintenance design.
Figure 3General framework of test strategy optimization based on soft sensing and ensemble belief measurement.
Figure 4Fault tree of test strategy optimization based on soft sensing and ensemble belief measurement.
Figure 5Target analog circuit.
Details for the components of the circuit.
| Components | Nominal Value | Tolerance | Subsystem |
|---|---|---|---|
| R1 | 320 kΩ | 10% | High-Pass Filter 1 F1 = 10 Hz |
| R2 | 320 kΩ | 10% | |
| C1 | 50 nF | 5% | |
| C2 | 50 nF | 5% | |
| Av1 | 1.75 | 1% | |
| R3 | 32 Ω | 10% | Low-Pass Filter 1 F2 = 100 kHz |
| R4 | 32 Ω | 10% | |
| C3 | 50 nF | 5% | |
| C4 | 50 nF | 5% | |
| Av2 | 1.75 | 1% | |
| R5 | 320 Ω | 10% | High-Pass Filter 2 F3 = 10 kHz |
| R6 | 320 Ω | 10% | |
| C5 | 50 nF | 5% | |
| C6 | 50 nF | 5% | |
| Av3 | 1.75 | 1% | |
| R7 | 32 kΩ | 10% | Low-Pass Filter 2 F4 = 100 Hz |
| R8 | 32 kΩ | 10% | |
| C7 | 50 nF | 5% | |
| C8 | 50 nF | 5% | |
| Av4 | 1.75 | 1% | |
| R9 | 1 kΩ | 1% | Adder |
| R10 | 1 kΩ | 1% | |
| R11 | 1 kΩ | 1% |
Denotation of fault states.
| Fault Index | Av1 Value Range | Av2 Value Range | Av3 Value Range | Av4 Value Range |
|---|---|---|---|---|
| S0(normal) | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) |
| S1 | (1.60,1.70) | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) |
| S2 | (1.80,1.90) | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) |
| S3 | (1.50,1.60) | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) |
| S4 | (1.90,2.00) | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) |
| S5 | (1.70,1.80) | (1.60,1.70) | (1.70,1.80) | (1.70,1.80) |
| S6 | (1.70,1.80) |
| (1.70,1.80) | (1.70,1.80) |
| S7 | (1.70,1.80) | (1.50,1.60) | (1.70,1.80) | (1.70,1.80) |
| S8 | (1.70,1.80) | (1.90,2.00) |
| (1.70,1.80) |
| S9 | (1.70,1.80) | (1.70,1.80) | (1.60,1.70) | (1.70,1.80) |
| S10 | (1.70,1.80) | (1.70,1.80) | (1.80,1.90) | (1.70,1.80) |
| S11 | (1.70,1.80) | (1.70,1.80) | (1.50,1.60) | (1.70,1.80) |
| S12 | (1.70,1.80) | (1.70,1.80) | (1.90,2.00) | (1.70,1.80) |
| S13 | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) | (1.60,1.70) |
| S14 | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) | (1.80,1.90) |
| S15 | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) | (1.50,1.60) |
| S16 | (1.70,1.80) | (1.70,1.80) | (1.70,1.80) |
|
Performance comparison.
| Method | Performance | S0 | S1 | S2 | S3 | S4 | S5 | S6 | S7 | S8 | S9 | S10 | S11 | S12 | S13 | S14 | S15 | S16 |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| HMM | FAR | 25.0 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 20.00 | 33.3 | 0.00 | 20.0 | 0.00 | 0.00 | 0.00 | 52.6 | 33.3 | 16.7 |
| FDR | 96.3 | 100 | 100 | 100 | 100 | 98.8 | 96.3 | 100 | 100 | 100 | 100 | 100 | 100 | 98.7 | 98.7 | 100 | 98.7 | |
| accuracy | 95.3 | 100 | 100 | 100 | 100 | 97.7 | 95.3 | 100 | 98.9 | 100 | 100 | 100 | 100 | 95.3 | 96.5 | 98.8 | 98.8 | |
| SVM | FAR | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 |
| FDR | 92.3 | 94.1 | 94.1 | 98.8 | 96.4 | 94.1 | 94.1 | 97.6 | 100 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 96.4 | 97.6 | |
| accuracy | 92.9 | 94.1 | 94.1 | 98.9 | 96.5 | 94.1 | 94.1 | 97.7 | 100 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 96.5 | 97.7 | |
| RBF | FAR | 33.3 | 66.7 | 33.3 | 33.2 | 36.5 | 0.00 | 0.00 | 37.5 | 0.00 | 0.00 | 0.00 | 50.0 | 60.0 | 33.3 | 60.0 | 54.4 | 28.6 |
| FDR | 92.9 | 95.1 | 93.9 | 98.7 | 100 | 96.4 | 100 | 100 | 100 | 95.2 | 94.1 | 100 | 98.7 | 96.3 | 96.3 | 100 | 100 | |
| accuracy | 91.7 | 93.0 | 95.1 | 96.5 | 90.6 | 96.5 | 96.5 | 96.5 | 100 | 96.5 | 100 | 95.3 | 94.1 | 94.1 | 95.3 | 93.0 | 97.7 | |
| PCA | FAR | 25.0 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 20.0 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 28.6 | 0.00 | 0.00 |
| FDR | 96.3 | 100 | 100 | 100 | 100 | 100 | 98.8 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | |
| accuracy | 95.3 | 100 | 100 | 100 | 100 | 100 | 97.7 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 97.7 | 100 | 100 | |
| PCA | FAR | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 2.30 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 |
| FDR | 93.0 | 94.1 | 94.1 | 98.8 | 96.4 | 94.1 | 94.1 | 97.6 | 100 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 96.4 | 97.6 | |
| accuracy | 93.0 | 94.1 | 94.1 | 98.9 | 96.5 | 94.1 | 97.7 | 100 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 94.1 | 96.5 | 97.7 | |
| ELM | FAR | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 2.30 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 |
| FDR | 91.4 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 96.4 | 97.6 | |
| accuracy | 92.3 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 96.4 | 97.6 | |
| OURS | FAR | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 | 0.00 |
| FDR | 99.7 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | |
| accuracy | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 | 100 |
Figure 6Analog circuit diagnostic tree.
Figure 7Analog circuit diagnostic tree potential ELM model accuracy comparison.
Figure 8Potential ELM model accuracy comparison.
Figure 9Test sequence accuracy comparison: (a) S0 test sequence, (b) S3 test sequence, (c) S8 test sequence, and (d) S15 test sequence.