| Literature DB >> 35334736 |
Ming Yuan1, Chunhui Li1, Sheng Zhang2, Yannan Xie3.
Abstract
Triboelectric nanogenerators (TENGs) have high potential in self-powered sensing and energy harvesting applications. In general, TENGs' internal source resistance is high, and their output power varies under different load resistance values. Therefore, a resistance box is required to evaluate their energy harvesting performance and obtain the power curve under different load values. The load tuning process is usually performed by hand. This repetitive process is time-consuming and error-prone. Consequently, an Automated Power Evaluation Workbench (APEW) is developed, making the resistance switching and power measuring process program-controlled. The resistance value is resolved using the Octal decomposition principle. In addition, a resistance synthesis algorithm is proposed to alter the resistance value with a minimum step of 1 Ohm. The target resistance value is physically synthesized by relay switching, while digital lines control the relays. The proposed APEW is then evaluated experimentally, and the obtained results are compared with those of the traditional manual switching approach. It is deduced that the two power curves are almost identical. Therefore, it is believed that the proposed APEW will play a crucial role in TENG's further development.Entities:
Keywords: automation test; power evaluation; resistance synthesis; triboelectric nanogenerator
Year: 2022 PMID: 35334736 PMCID: PMC8955910 DOI: 10.3390/mi13030444
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 2.891
Figure 1Schematic diagram of the TENG.
Figure 2Schematic diagram of the resistance synthesis using the Octal decomposition principle.
theoretical resistance values.
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| 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 |
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| 1 | 8 | 64 | 512 | 4.096 k | 32.768 k | 262.144 k | 2.097152 M |
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| 2 | 16 | 128 | 1.024 k | 8.192 k | 65.536 k | 524.288 k | 4.194304 M |
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| 3 | 24 | 192 | 1.536 k | 12.288 k | 98.304 k | 786.432 k | 6.291456 M |
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| 4 | 32 | 256 | 2.048 k | 16.384 k | 131.072 k | 1.048576 M | 8.388608 M |
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| 5 | 40 | 320 | 2.56 k | 20.48 k | 163.84 k | 1.31072 M | 10.485760 M |
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| 6 | 48 | 384 | 3.072 k | 24.576 k | 196.608 k | 1.572864 M | 12.582912 M |
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| 7 | 56 | 448 | 3.584 k | 28.672 k | 229.376 k | 1.835008 M | 14.680064 M |
Resistance values used for implementation.
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| 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 |
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| 1 | 8 | 64 | 512 | 4.096 k | 32.7 k | 261.6 k | 2 M |
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| 2 | 16 | 128 | 1.024 k | 8.192 k | 65.4 k | 523.2 k | 4 M |
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| 3 | 24 | 192 | 1.536 k | 12.288 k | 98.1 k | 784.8 k | 6 M |
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| 4 | 32 | 256 | 2.048 k | 16.384 k | 130.8 k | 1.046 M | 8 M |
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| 5 | 40 | 320 | 2.56 k | 20.48 k | 163.5 k | 1.308 M | 10 M |
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| 6 | 48 | 384 | 3.072 k | 24.576 k | 196.2 k | 1.5696 M | 12 M |
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| 7 | 56 | 448 | 3.584 k | 28.672 k | 228.9 k | 1.8312 M | 14 M |
Figure 3Flowchart of the resistance schedule algorithm.
Figure 4The APEW components.
Figure 5The synthesized resistance measurement data.
Figure 6Schematic diagram of the APEW system.
Figure 7The APEW control panel.
Figure 8The test results of the TENG output power.