| Literature DB >> 35334731 |
Zengtian Lu1, Sulei Fu2, Zhibin Xu1, Weibiao Wang3, Qiaozhen Zhang4, Jianrun Zhang1, Hui Zhang1.
Abstract
To cope with ubiquitous wireless connectivity and the increased and faster data delivery in 5G communication, surface acoustic wave (SAW) filters are progressively requiring wider bandwidths. Conventional bulk 15°YX-LiNbO3 substrates with a large coupling coefficient (K2) are attractive for the low-cost mass production of wideband SAW filters, but these generally suffer from spurious responses, limiting their practical application. In this work, a novel and simple SAW configuration is proposed that uses thickness-modulated interdigital transducer (IDT) structures to overcome the limitations set by spurious responses. Different from the conventional design where the thicknesses of the IDT electrodes in the series and parallel resonators generally kept the same, the proposed configuration adopts IDT electrodes of different thicknesses in the series and shunt resonators to suppress or remove unwanted spurious Rayleigh modes from the filter passband. Two different ultra-wideband SAW filter designs employing thickness-modulated IDTs were designed and fabricated to validate the effective suppression of spurious modes. The SAW filters experimentally featured spurious-free responses in the passband as well as a large 3 dB fractional bandwidth (FBW) in the 18.0% and 24.1% ranges and low insertion losses below 1 dB. This work can significantly broaden the range of applications for SAW devices and can open a pathway to commercialize ultra-wideband SAW filters in 5G communication systems.Entities:
Keywords: LiNbO3; filter; spurious mode; surface acoustic wave; wideband
Year: 2022 PMID: 35334731 PMCID: PMC8950525 DOI: 10.3390/mi13030439
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 2.891
Figure 1(a) The simulated admittance curves at different normalized thicknesses hCu/λ on 15°YX-LiNbO3 substrate; (b) displacement field of Rayleigh and SH modes; (c) the simulated and measured admittance curves at normalized thicknesses hCu/λ of 8%, 10% and 12%; (d,e) velocities and electromechanical coupling coefficients of two modes extracted from the simulated admittance curves.
Figure 2(a) Optical microscope image of the fabricated filter using the conventional design; (b) zoomed-in optical microscope image; (c) SEM image of the IDT fingers; (d) simulated and measured frequency responses of the filter; (e) zoomed-in simulated and measured frequency responses of the filter.
Figure 3(a) The basic structure of a conventional ladder-type SAW filter. (b,c) Schematic diagram of the existence of spurious modes in the conventional filter.
Figure 4(a) Design of thickness-modulated IDT structures in this work. (b,c) Schematic diagrams of two thickness-modulated IDT designs.
Figure 5(a) The filter topology; (b) simulated admittance curves of series and shunt resonators. The curves were manually shifted by 40 dB for better comparison; (c) optical microscope of the fabricated filter; (d) simulated and measured frequency responses of the filter; (e) zoomed-in simulated and measured frequency responses of the filter.
The design parameters of the SAW filter using the first IDT thickness-modulated configuration.
| Resonator | Metallization Ratio | Number of IDT Electrodes | Number of Reflector | |||
|---|---|---|---|---|---|---|
| S1 | 220 | 2.26 | 9.73% | 0.5 | 112 | 20 |
| S2 | 2.24 | 9.82% | 0.5 | 123 | 20 | |
| S3 | 2.30 | 9.56% | 0.5 | 191 | 20 | |
| S4 | 2.19 | 10.05% | 0.5 | 99 | 20 | |
| S5 | 2.22 | 9.91% | 0.5 | 79 | 20 | |
| P1 | 255 | 2.61 | 9.77% | 0.5 | 237 | 20 |
| P2 | 2.55 | 10.00% | 0.5 | 163 | 20 | |
| P3 | 2.56 | 9.96% | 0.5 | 177 | 20 | |
| P4 | 2.57 | 9.92% | 0.5 | 163 | 20 |
Figure 6(a) The filter topology; (b) simulated admittance curves of series and shunt resonators; (c) optical microscope of the fabricated filter; (d) simulated and measured frequency responses of the filter.
The design parameters of the SAW filter using the second IDT thickness-modulated configuration.
| Resonator | Metallization Ratio | Number of IDT Electrodes | Number of Reflector | |||
|---|---|---|---|---|---|---|
| S1 | 140 | 1.28 | 10.93% | 0.5 | 237 | 20 |
| S2 | 1.46 | 9.56% | 0.5 | 307 | 20 | |
| S3 | 1.45 | 9.66% | 0.5 | 307 | 20 | |
| S4 | 1.41 | 9.92% | 0.5 | 223 | 20 | |
| P1 | 165 | 1.83 | 9.02% | 0.5 | 69 | 20 |
| P2 | 1.65 | 10.00% | 0.5 | 69 | 20 | |
| P3 | 1.68 | 9.82% | 0.5 | 69 | 20 | |
| P4 | 1.78 | 9.27% | 0.5 | 69 | 20 |