| Literature DB >> 35329548 |
Wenyu Zhang1, Zhifang Zhou1, Yueyang Yang1, Yunpeng Zheng1, Yushuai Xu1, Mingchu Zou1, Ce-Wen Nan1, Yuan-Hua Lin1.
Abstract
Because of the high carrier concentration, copper telluride (Cu2Te) has a relatively low Seebeck coefficient and high thermal conductivity, which are not good for its thermoelectric performance. To simultaneously optimize carrier concentration, lower thermal conductivity and improve the stability, BiCuTeO, an oxygen containing compound with lower carrier concentration, is in situ formed in Cu2Te by a method of combining self-propagating high-temperature synthesis (SHS) with spark plasma sintering (SPS). With the incorporation of BiCuTeO, the carrier concentration decreased from 8.1 × 1020 to 3.8 × 1020 cm-3, bringing the increase of power factor from ~1.91 to ~2.97 μW cm-1 K-2 at normal temperature. At the same time, thermal conductivity reduced from 2.61 to 1.48 W m-1 K-1 at 623 K. Consequently, (Cu2Te)0.95-(BiCuTeO)0.05 composite sample reached a relatively high ZT value of 0.13 at 723 K, which is 41% higher than that of Cu2Te.Entities:
Keywords: Cu2Te-BiCuTeO composites; carrier concentration; thermoelectric materials
Year: 2022 PMID: 35329548 PMCID: PMC8953958 DOI: 10.3390/ma15062096
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Bulk XRD patterns for (Cu2Te)1−x-(BiCuTeO) (x = 0, 0.05, 0.1, 0.2, 0.3, 0.4).
Figure 2(a) FESEM fractography for (Cu2Te)0.9-(BiCuTeO)0.1; (b) EDS for (Cu2Te)0.9-(BiCuTeO)0.1.
Figure 3(a) TEM and EDS for (Cu2Te)0.9-(BiCuTeO)0.1. (b) HRTEM for (Cu2Te)0.9-(BiCuTeO)0.1. The insets are the corresponding fast Fourier transform (FFT) patterns for the areas marked in Figure 3b.
Figure 4In plane electrical properties of (Cu2Te)1−x-(BiCuTeO): (a) electrical conductivity, (b) Seebeck coefficient, (c) power factor. Electrical properties of (Cu2Te)1−x-(BiCuTeO); out-of-plane electrical properties of (Cu2Te)1−x-(BiCuTeO): (d) electrical conductivity, (e) Seebeck coefficient, (f) PF.
Carrier concentration and mobility of (Cu2Te)1−x-(BiCuTeO) (RH is Hall coefficient).
| Samples | ||||
|---|---|---|---|---|
| Cu2Te | 8.085 × 1020 | 58.58 | 7.819 × 10−3 | 0.663 |
| (Cu2Te)0.95-(BiCuTeO)0.05 | 4.459 × 1020 | 54.71 | 1.400 × 10−2 | 0.785 |
| (Cu2Te)0.9-(BiCuTeO)0.1 | 3.804 × 1020 | 58.47 | 1.641 × 10−2 | 0.716 |
| (Cu2Te)0.8-(BiCuTeO)0.2 | 1.691 × 1020 | 295.40 | 3.692 × 10−2 | 0.025 |
| (Cu2Te)0.7-(BiCuTeO)0.3 | 2.289 × 1020 | 151.50 | 2.727 × 10−2 | 0.052 |
| (Cu2Te)0.6-(BiCuTeO)0.4 | 2.379 × 1020 | 102.90 | 2.627 × 10−2 | 0.110 |
Figure 5(a) Thermal conductivity of (Cu2Te)1−x-(BiCuTeO) as a function of temperature. (b) Lattice thermal conductivity (κL) and carrier thermal conductivity (κe) as a function of BiCuTeO content at room temperature.
Figure 6ZT of (Cu2Te)1−x-(BiCuTeO)x as a function of temperature.