| Literature DB >> 35322120 |
Anooja Jayaraj1, Ilaria Siloi2, Marco Fornari3, Marco Buongiorno Nardelli4,5.
Abstract
Regardless of its success, the constant relaxation time approximation has limited validity. Temperature and energy dependent effects are important to match experimental trends even in simple situations. We present the implementation of relaxation time approximation models in the calculation of Boltzmann transport in PAOFLOW 2.0 and apply those to model band-structures. In addition, using a self-consistent fitting of the model parameters to experimental conductivity data, we provide a flexible tool to extract scattering rates with high accuracy. We illustrate the approximations using simple models and then apply the method to GaAs, Si, [Formula: see text], and [Formula: see text].Entities:
Year: 2022 PMID: 35322120 PMCID: PMC8943075 DOI: 10.1038/s41598-022-08931-5
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Symbols and units for the scattering parameters required in various scattering models.
| Parameter | Symbol | Units |
|---|---|---|
| Mass density | kg/m | |
| Lattice constant | a | m |
| Low freq. dielectric constant | – | |
| High freq. dielectric constant | – | |
| Acoustic velocity | v | m/s |
| Effective mass ratio | – | |
| Acoustic deformation potential | eV | |
| Optical deformation potential | eV | |
| Optical phonon energy | eV | |
| Number of impurities | cm | |
| Charge on impurity | – | |
| Piezoelectric constant | p | C/m |
Figure 1Band-structure of a cubium with two bands (top left panel, dashed line) and a parabolic fit near point (solid line). In the top right, bottom left, and bottom right panels, the Seebeck coefficient, the conductivity, and the carrier concentration, respectively, are reported.
Figure 2Band-structure of a graphene model and parabolic fit at K (left panel, dashed and solid line, respectively). The right panel shows the corresponding conductivities computed with Eqs. (14), (17), and PAOFLOW.
Figure 3Electronic conductivity as a function of temperature at various chemical potentials (representing the doping level, referred to the middle of the gap). The left panel corresponds to graphene (with zero band gap) and the right panel corresponds to cubium with a band gap of 0.5 eV. The red lines denote the conductivity calculated using the CRTA whereas the black lines correspond to the conductivity calculated using the RTA; different markers correspond to different chemical potentials as in the legends.
Symbols and units of the parameters to be input in calculation of scattering models. The values for Si and GaAs are obtained from Ref.[18], for from Ref.[20] and for from Refs.[30,31].
| Symbol | Units | GaAs | Si | ||
|---|---|---|---|---|---|
| kg/m | |||||
| a | m | ||||
| – | 26.7 | 13.5 | 11.7 | 33.5 | |
| – | 14.2 | 11.6 | – | 25.6 | |
| v | m/s | ||||
| m | – | 0.3 | 0.7 | 0.29 | 3 |
| D | eV | 6.5 | 7 | 9.5 | 5 |
| D | eV | – | – | ||
| eV | [0.0205,0.0248,0.031] | [0.03536] | – | [0.0264] | |
| p | C/m | – | 0.16 | – | – |
Figure 4A comparison of the scattering rates in GaAs obtained using the original scattering models (labelled RTA) and those obtained using the fitting procedure (labelled RTA fitted) for samples of two different doping concentrations. The left panel corresponds to an n-type sample with a doping concentration of while the right panel corresponds to an n-type doping of . The inset shows the electrical conductivity calculated using both the original and the fitted scattering rates.The experimental data have been obtained from Ref.[32].
Figure 5Conductivities and scattering rates for the different Si samples in a low temperature regime. The left panel shows the data for a sample with n-type doping with a carrier concentration of cm while the right panel shows the data for a sample with n-type doping with a carrier concentration of cm. The inset shows the goodness of fit of theoretical electrical conductivity to experiments resulting from the fitting procedure as well as the electrical conductivity calculated using the original scattering models
Figure 6A comparison of the scattering rates in MgSb obtained using the original scattering models (RTA) and those obtained using the fitting procedure (RTA). The left panel corresponds to an n-type sample with a doping concentration of while the right panel corresponds to an n-type doping of . The inset shows the electrical conductivity calculated using the respective scattering rates.The experimental data have been obtained from Ref.[20]
Figure 7A comparison of the scattering rates in CoSb obtained using the original scattering models (RTA) and those obtained using the fitting procedure (RTA) are shown. The top left panel corresponds to a p-type sample with a doping concentration of while the top right panel corresponds to a p-type doping of . The bottom left panel corresponds to an n-type sample with a doping concentration of while the bottom right panel corresponds to an n-type doping of . The inset shows the electrical resistivity calculated using the both the original and fitted scattering rates. The experimental data have been obtained from Ref.[35].