| Literature DB >> 35314702 |
Bhaskar Ghawri1, Phanibhusan S Mahapatra2, Manjari Garg3, Shinjan Mandal4, Saisab Bhowmik5, Aditya Jayaraman4, Radhika Soni5, Kenji Watanabe6, Takashi Taniguchi7, H R Krishnamurthy4, Manish Jain4, Sumilan Banerjee4, U Chandni5, Arindam Ghosh8,9.
Abstract
The planar assembly of twisted bilayer graphene (tBLG) hosts multitude of interaction-driven phases when the relative rotation is close to the magic angle (θm = 1.1∘). This includes correlation-induced ground states that reveal spontaneous symmetry breaking at low temperature, as well as possibility of non-Fermi liquid (NFL) excitations. However, experimentally, manifestation of NFL effects in transport properties of twisted bilayer graphene remains ambiguous. Here we report simultaneous measurements of electrical resistivity (ρ) and thermoelectric power (S) in tBLG for several twist angles between θ ~ 1.0 - 1.7∘. We observe an emergent violation of the semiclassical Mott relation in the form of excess S close to half-filling for θ ~ 1.6∘ that vanishes for θ ≳ 2∘. The excess S (≈2 μV/K at low temperatures T ~ 10 K at θ ≈ 1.6∘) persists upto ≈40 K, and is accompanied by metallic T-linear ρ with transport scattering rate (τ-1) of near-Planckian magnitude τ-1 ~ kBT/ℏ. Closer to θm, the excess S was also observed for fractional band filling (ν ≈ 0.5). The combination of non-trivial electrical transport and violation of Mott relation provides compelling evidence of NFL physics intrinsic to tBLG.Entities:
Year: 2022 PMID: 35314702 PMCID: PMC8938509 DOI: 10.1038/s41467-022-29198-4
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Electrical transport in twisted bilayer graphene.
a Temperature-dependent resistance R as a function of band filling ν for four different devices with twist angle θ ≈ 1.01∘, 1.24∘, 1.6∘ and 1.7∘. The inset in the bottom panel shows the optical image of a typical device with current and voltage leads marked for resistivity measurements. The scale bar represents a length of 5 μm. ρ as a function of T for a few representative values of ν for (b) θ ≈ 1.01∘, (c) 1.24∘ and (d) 1. 6∘. The various curves for fractional ν in (c) represent the T-dependence of the CI/CS states as marked in the second panel of (a). e Comparison of T-dependence of ρ at ν = −2 for different twist angles. The solid lines represent T-linearity.
Fig. 2Thermoelectric transport in twisted bilayer graphene.
a The cross-sectional view of the device, showing the constituent layers, electrical contacts, and the gate assembly. b In-plane heating and measurement schematic for thermovoltage V2 in the tBLG region. Density dependence of (in the units of VA−2 × 106) measured at 5 K for (c) θ ≈ 1.01∘, d 1.24∘, and at 3 K for (e) 1. 6∘ device. The different curves in each panel represent the measured at different I. The bottom graphs in each panel show the numerically calculated α = (1/R)dR/dn (in the units of m2) for comparison.
Fig. 3Comparison with semiclassical Mott relation at ~ 1.6∘.
a Electronic band structure and density of states (DOS) of tBLG (θ = 1. 6∘) calculated using tight binding model. The bands shown in red are the low energy active bands. b Comparison between the measured V2 (black lines) and that calculated (orange line) from the semiclassical Mott relation (Eq. (2)) for θ ≈ 1. 6∘ at three representative temperatures. ΔT is obtained as a fitting parameter to match SMR with the experimental V2 at the CNP. c Doping dependence of S for θ ≈ 1. 7∘ compared to that of the SMR at 5 K. d Temperature dependence of S at various band filling factors. The dashed lines show the S ∝ T dependence. The inset shows the T dependence of at ν = ±2.
Fig. 4Breakdown of semiclassical Mott relation and scattering rate.
a Surface plot of as a function of T and ν for θ ≈ 1. 6∘. b (S − SMott) at 10 K for θ ≈ 1. 6∘ and θ ~ 4∘. c dρ/dT extracted in the T-linear regime at different ν for the three twist angles. d The estimated dimensionless pre-factor C of the scattering rate Γ = CkBT/ℏ as a function of ν. e Seebeck coefficient S computed in DMFT with U = 38 meV as a function of filling ν for the four lowest bands at three temperatures T = 2 K, 14 K and 26 K, respectively.