| Literature DB >> 35268811 |
Ruijie Dai1,2, Tengzuo Huang1,2, Weijie Zhou1,2, Jinpeng Yang1,2, Hua Zhang1,2, Fayin Yu1,2, Anran Chen1,2, Feng Wang1,2, Jin Zhang1,2, Tao Sun1,2, Longzhou Zhang2.
Abstract
Reducing the surface reflectivity of silicon substrates is essential for preparing high-performance Si-based solar cells. We synthesized pyramid-nanowire-structured Si (Si-PNWs) anti-reflection substrates, which have excellent light-trapping ability (<4% reflectance). Furthermore, diethyl phthalate (DEP), a water-insoluble phthalic acid ester, was applied to optimize the Si-PNWs/PEDOT:PSS interface; the photoelectric conversion efficiency of heterojunction solar cells was shown to increase from 9.82% to 13.48%. We performed a detailed examination of the shape and optical characteristics of Si-PNWs, as well as associated photoelectric performance tests, to investigate the origin of performance improvements in Si-PNWs/PEDOT:PSS heterojunction solar cells (HSCs).Entities:
Keywords: heterojunction solar cells; interfaces; optical materials and properties; thin films
Year: 2022 PMID: 35268811 PMCID: PMC8911853 DOI: 10.3390/molecules27051710
Source DB: PubMed Journal: Molecules ISSN: 1420-3049 Impact factor: 4.411
Figure 1(a) Structure diagram of the Si-PNWs/PEDOT:PSS solar cells with DEP coating. (b) Energy band diagrams of the Si-PNWs/PEDOT:PSS solar cells.
Figure 2The devices produced using different AgNO3 concentrations (a–e) SEM images. (f) Reflectance.
Figure 3(a,b) SEM images of silicon nanowires and pyramids (c) J–V curves for the AgNO3 treated Si-PNWs solar cells.
Photoelectric property parameters and (%) of silicon solar cells fabricated using different AgNO3 concentrations.
| Concentration | JSC (mA/cm2) | VOC (V) | FF (%) | PCE (%) | |
|---|---|---|---|---|---|
| 1 mM | 8.41 | 31.35 | 0.57 | 59.09 | 10.69 |
| 3 mM | 5.79 | 32.15 | 0.58 | 69.96 | 11.30 |
| 5 mM | 4.68 | 33.59 | 0.59 | 60.98 | 12.18 |
| 7 mM | 5.64 | 33.19 | 0.58 | 58.40 | 11.23 |
| 8 mM | 6.19 | 31.94 | 0.57 | 56.39 | 10.34 |
Figure 4The devices coated with and without DEP: (a) J–V curves. (b) Reflectance. (c) Dark J-V curves. (d) Electrochemical impedance spectroscopy (EIS). (e) EQE. (f) Raman spectrum.
Photoelectric property parameters and (%) of devices with DEP and without DEP coating.
| Texture Structure | JSC (mA/cm2) | VOC (V) | FF | PCE (%) | |
|---|---|---|---|---|---|
| Si-PNWs | 4.68 | 33.59 | 0.59 | 60.98 | 12.18 |
| Si-PNWs with DEP | 3.89 | 34.06 | 0.61 | 65.11 | 13.48 |