| Literature DB >> 35245121 |
Andrea Marchetti1,2, Victoria Beltran1,2, Gert Nuyts1,2, Ferenc Borondics3, Steven De Meyer1,2, Marina Van Bos4, Jakub Jaroszewicz5, Elke Otten4, Marjolijn Debulpaep4, Karolien De Wael1,2.
Abstract
Optical photothermal infrared (O-PTIR) is a recently developed molecular spectroscopy technique that allows to noninvasively obtain chemical information on organic and inorganic samples at a submicrometric scale. The high spatial resolution (≈450 nm), lack of sample preparation, and comparability of the spectral results to traditional Fourier transform infrared spectroscopy make it a promising candidate for the analysis of cultural heritage. In this work, the potential of O-PTIR for the noninvasive characterization of small heritage objects (few cubic centimeters) is demonstrated on a series of degraded 16th century brass and glass decorative elements. These small and challenging samples, typically encountering limitations with existing noninvasive methods such as macroscopic x-ray powder diffraction and μRaman, were successfully characterized by O-PTIR, ultimately identifying the markers of glass-induced metal corrosion processes. The results clearly demonstrate how O-PTIR can be easily implemented in a noninvasive multianalytical strategy for the study of heritage materials, making it a fundamental tool for cultural heritage analyses.Entities:
Year: 2022 PMID: 35245121 PMCID: PMC8896789 DOI: 10.1126/sciadv.abl6769
Source DB: PubMed Journal: Sci Adv ISSN: 2375-2548 Impact factor: 14.136
Relevant features of the high spatial resolution molecular speciation techniques most commonly used for the analysis of cultural heritage objects (SR-μXRPD, SR-μFTIR, μRaman, and AFM-IR) and of the novel O-PTIR spectroscopy.
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| Invasive | No* | No† | No‡ | Yes | No‡ |
| Sample preparation | Complex§ | Complex§ | Not needed | Complex§ | Not needed |
| Maximum spatial | ≈50 × 50 nm2 | ≈10 × 10 μm2|| | ≈1 × 1 μm2¶ | ≈20 × 20 nm2 | |
| Materials detected | Crystalline only | Crystalline and | Crystalline and amorphous | Crystalline and | Crystalline and |
| Risk of beam damage | High | Low | Medium | Low | Low |
| Fluorescence | No | No | Yes | No | No |
| Benchtop equipment | No | No | Yes | Yes | Yes |
*Noninvasive applications limited to flat, convex, and/or very thin objects (SR-μXRPD).
†Noninvasive applications limited to very flat objects.
‡Sampling needed for large objects (larger than few square centimeters).
§Nonflat objects need to be prepared in cross section or, more often, in thin sections.
‖Diffraction limited (i.e., dependent on the wavelength of the incident light).
¶Depending on the wavelength of the visible laser and on the focusing optics.
Overview of the historical objects considered in this study.
Metal sequin (S), metal wires (W), and glass beads (B).
Fig. 1.High-resolution O-PTIR molecular imaging of degradation products on the surface of the degraded brass sequin (1S).
(A) OM photomicrograph of the area in analysis, in evidence the location of the representative spectra shown in (B) (numbered points) and of the imaged area (white rectangle). (B) Representative spectra of the imaged species and integration range (in gray). (C) Corresponding integration maps (30 × 62 μm with a pixel size of 2 μm) with tentative interpretation (integration range in cm−1). (D) Complementary SEM-EDX elemental imaging of the scanned area.
Fig. 3.O-PTIR point analysis of degradation products on the surface of a corroded brass wire (sample 2W).
(A) Locations analyzed (OM photomicrograph) and corresponding spectra. (B) Complementary SEM-EDX elemental imaging of the region of interest [white rectangle in (A)].
Fig. 2.O-PTIR point analysis of degradation products on the surface of a glass bead (sample 1B).
(A) Locations analyzed (OM photomicrograph) and corresponding spectra. (B) Complementary SEM-EDX elemental imaging of the region of interest.
Fig. 4.Experimental spectra of basic Cu formate.
(A) O-PTIR (green), SR-μFTIR (red), and μRaman (blue) on a corroded wire (sample 3W). a.u., arbitrary units. (B) XRPD collected on the corroded sequin (sample 1S), average diffractogram for a 3-mm-long line in the degraded area of the sample. In evidence the diffraction peaks associated to Cu2(OH)3(HCOO) (*) () and high-Cu brass (X) ().