| Literature DB >> 35215045 |
Xiaoxiao Duan1, Shuming Ye1, Jing Yang2, Chen Li1, Chunjiang Lu1, Xinpeng He1, Luran Zhang1, Rongfei Wang1, Feng Qiu1, Jie Yang1, Haoyang Cui3, Chong Wang1.
Abstract
Ferromagnetic semiconductors (FMSs) exhibit great potential in spintronic applications. It is believed that a revolution of microelectronic techniques can take off, once the challenges of FMSs in both the room-temperature stability of the ferromagnetic phase and the compatibility with Si-based technology are overcome. In this article, the MnxGe1-x/Si quantum dots (QDs) with the Curie temperature (TC) higher than the room temperature were grown by ion beam co-sputtering (IBCS). With the Mn doping level increasing, the ripening growth of MnGe QDs occurs due to self-assembly via the Stranski-Krastanov (SK) growth mode. The surface-enhanced Raman scattering effect of Mn sites observed in MnGe QDs are used to reveal the distribution behavior of Mn atoms in QDs and the Si buffer layer. The Curie temperature of MnxGe1-x QDs increases, then slightly decreases with increasing the Mn doping level, and reaches its maximum value of 321 K at the doping level of 0.068. After a low-temperature and short-time annealing, the TC value of Mn0.068Ge0.932 QDs increases from 321 K to 383 K. The higher Ge composition and residual strain in the IBCS grown MnxGe1-x QDs are proposed to be responsible for maintaining the ferromagnetic phase above room temperature.Entities:
Keywords: Curie temperature; MnGe quantum dots; doping level; ferromagnetic nanostructure
Year: 2022 PMID: 35215045 PMCID: PMC8879400 DOI: 10.3390/nano12040716
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1The patterns of Mn slices distributed on Ge target with an increase in Mn-slice number.
Figure 2(a) The X-ray energy spectrum of the samples with an increase in Mn-slice number. (b) The Mn-slice number dependence of the Mn content x in the MnxGe1−x film grown by ion beam co-sputtering.
Figure 3AFM surface morphology images of MnGe QD samples with Mn content of 4.6% (a), 5.8% (b), 6.8% (c) and 7.5% (d), respectively.
Figure 4Statistic histograms for the diameter (a–d) and height (e–h) of the MnGe QDs at different Mn contents.
Figure 5(a) Raman spectra of the MnGe QDs samples with different Mn contents and the sample with only Si buffer layer. (b) Raman intensity ratio of Ge-Ge peak to Si-Si peak dependence of Mn concentration.
Figure 6XPS spectra and their fitted lines for Mn0.068Ge0.932 (a,b) and Mn0.075Ge0.925 (c,d) QDs sample.
Figure 7The hysteresis loops of samples with different Mn dopant concentrations at different test temperatures. The hysteresis loops of Mn0.032Ge0.968, Mn0.046Ge0.954 and Mn0.058Ge0.942 QDs samples at 10 K (a–c) and the hysteresis loops of Mn0.068Ge0.932 (d–g) and Mn0.075Ge0.925 QDs (h–k) samples at different temperatures from 10 K to 300 K, respectively. It is noted that the diamagnetic contributions from the substrates were subtracted.
Figure 8(a) Temperature dependence of magnetization for the samples with different Mn dopant concentrations. The testing temperature increased from 3 K to 400 K. An external magnetic field of 200 Oe is applied parallel to the sample surface. (b) The demagnetization ratio as a function of temperature for Mn0.068Ge0.932 QDs sample. (c) Curie temperature dependence of Mn dopant concentration. (d) The demagnetization ratio as a function of temperature for Mn0.068Ge0.932 QDs sample after annealing.