| Literature DB >> 35211061 |
María Buenadicha-Mateos1, María Isabel Sánchez-Hernández1, Óscar Rodrigo González-López1.
Abstract
This study analyses the emotional exhaustion of students inhigher education, derived from the extremely technology-relatedstrain associated to the current COVID-19 pandemic in a conservation of resources' approach. Technostress, as source of emotional exhaustion, was investigated in a sample of 333 students in a medium size public university in Spain. Data was collected in May 2020, during the COVID lockdown. After literature review, a structural model was developed, linking technostress with emotional exhaustion. Results confirm the expected cause-effect relationships. In addition, the study reveals two mediator variables that must be considered when managing students' suffering, perceived stress and intrapersonal conflicts. This study contributes to the academic literature in the field of managing and mitigating suffering. They do so by providing both new knowledge and empirical evidence on the effects of technostress in the new generations that will soon join the working life.Entities:
Keywords: emotional exhaustion; higher education; interpersonal conflicts; perceived stress; suffering; technostress
Year: 2022 PMID: 35211061 PMCID: PMC8861518 DOI: 10.3389/fpsyg.2022.792606
Source DB: PubMed Journal: Front Psychol ISSN: 1664-1078
FIGURE 1Theoretical model.
Instrument.
| Techno-stress (TE) | |
| Anxiety | I feel tense and anxious when working with technology. I doubt myself when using technology afraid of making mistakes. It scares me to think that I can destroy a lot of information due to the incorrect use of technology. Working with technology makes me feel uncomfortable, irritable and impatient. |
| Fatigue | I find it hard to relax after a day of using technology. When I finish working with technology, I feel exhausted. I’m so tired of working with technology that I can’t do anything else. It is difficult to concentrate after working with technologies. |
| Skepticism | I am less and less interested in technology. I feel less involved with the use of technology. I am more cynical about the contribution of technologies. I doubt the meaning of working with technologies. |
| Ineffectiveness | I feel that I am inefficient when using technology. I find it difficult to work with technology. People say that I am inefficient when I use technology. I’m not sure I’m completing tasks well when using technology. |
| Perceived stress (PS) | I have felt unable to control the important things in your life. I have felt nervous or stressed. I have been confident about my ability to handle my personal problems (reverse). I have felt that things are going well for me (reverse). I felt like I had everything under control (reverse). I have felt that the difficulties accumulate so much that I cannot overcome them. |
| Intrapersonal conflics (IC) | I plan my next Internet connection very frequently. I get irritated when someone bothers me while I’m online. I find it easier or more comfortable to interact with people online than in person. |
| Emotional exahustion (EE) | I feel emotionally exhausted because of my studies. I feel tired at the end of the day. When I get up in the morning and face another day, I feel fatigued. I feel that studying all day takes a lot of effort and makes me tired. I feel burned out by my studies. I feel frustrated about my studies. I feel finished in my studies, at the limit of my possibilities. |
FIGURE 2Main results.
Hypotheses testing.
| Hypothesis | Path coefficient (original) | Path coefficient (sample) | St. Error | Confidence interval [2.5–97.5]% | Significant ( | |
|
| ||||||
| H1: TE → EE | 0.163 | 0.163 | 0.051 | 0.065–0.262 | 3.179 | 0.001 |
| H2a: TE → PE | 0.250 | 0.256 | 0.055 | 0.144–0.360 | 4.538 | 0.000 |
| H2b: PE → EE | 0.497 | 0.481 | 0.045 | 0.390–0.565 | 10.733 | 0.000 |
| H3a: TE → IC | 0.189 | 0.195 | 0.057 | 0.080–0.304 | 3.327 | 0.001 |
| H3b: IC → EE | 0.177 | 0.180 | 0.049 | 0.083–0.276 | 3.595 | 0.000 |
|
| ||||||
| H2: TE → PE → EE | 0.120 | 0.123 | 0.029 | 0.067–0.182 | 4.127 | 0.000 |
| H3: TE → IC → EE | 0.033 | 0.034 | 0.013 | 0.012–0.062 | 2.639 | 0.008 |