| Literature DB >> 35190585 |
Vitalii Stetsovych1, Simon Feigl1, Radovan Vranik1, Bareld Wit1, Eva Rauls2, Jindřich Nejedlý3, Michal Šámal3, Ivo Starý3, Stefan Müllegger4.
Abstract
Dielectric relaxation lies at the heart of well-established techniques of dielectric spectroscopy essential to diverse fields of research and technology. We report an experimental route for increasing the sensitivity of dielectric spectroscopy ultimately towards the scale of a single molecule. We use the method of radio frequency scanning tunneling microscopy to excite a single molecule junction based on a polar substituted helicene molecule by an electric field oscillating at 2-5 GHz. We detect the dielectric relaxation of the single molecule junction indirectly via its effect of power dissipation, which causes lateral displacement. From our data we determine a corresponding relaxation time of about 300 ps-consistent with literature values of similar helicene derivatives obtained by conventional methods of dielectric spectroscopy.Entities:
Year: 2022 PMID: 35190585 PMCID: PMC8861178 DOI: 10.1038/s41598-022-06684-9
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) DFT simulation of the SMJ formed by a single BA7H molecule covalently bound between two Ag electrodes. (b,c) Dependence of the current through the SMJ during formation (b) and breaking (c) of the SMJ by controlled variation of the STM tip-sample separation. (d) STM images (scale bar is 1 nm; tunnel conditions: V, 9 pA; z scale is 350 pm) of a single BA7H molecule before formation (top) and after breaking (bottom) of the SMJ. (e) Height profiles across the dashed lines labelled 1 and 2 in (d) obtained before formation of the SMJ and after breaking the SMJ.
Figure 2(a) STM images of a single BA7H molecule before and after RF pulsing ( nm; z scale 350 pm; tunnel conditions: + 0.5 V 9 pA). The cross marks the initial position of the molecule. (b) Typical tunnel current traces during RF pulse for the case that SMJ displacement occurs. (c) Frequency dependence of the probability p of lateral displacement of the SMJ (see text) for constant RF amplitude of mV.
Figure 3(a) Dependence of p on measured at 3.37 GHz, see text. (b) Frequency dependent transmission of our RFSTM instrument in the bandwidth 2–4.5 GHz. Uncertainty is dB.