| Literature DB >> 35160630 |
Bita Ghasemi1, Jakub Ševčík1, Vojtěch Nádaždy2, Karol Végsö2, Peter Šiffalovič2, Pavel Urbánek1, Ivo Kuřitka1.
Abstract
Electronic devices based on polymer thin films have experienced a tremendous increase in their efficiency in the last two decades. One of the critical factors that affects the efficiency of polymer solar cells or light emitting devices is the presence of structural defects that controls non-radiative recombination. The purpose of this report is to demonstrate a non-trivial thickness dependence of optoelectronic properties and structure (dis)order in thin conductive poly(9,9-dioctyfluorene-alt-benzothiadiazole), F8BT, polymer films. The UV-Vis absorption spectra exhibited blue shift and peak broadening; significant changes in 0-0 and 0-1 radiative transition intensity was found in photoluminescence emission spectra. The density of state (DOS) was directly mapped by energy resolved-electrochemical impedance spectroscopy (ER-EIS). Satellite states 0.5 eV below the lowest unoccupied molecular orbital (LUMO) band were revealed for the thinner polymer films. Moreover, the decreasing of the deep states density in the band gap manifested an increment in the material structural ordering with increasing thickness. Changes in the ratio between crystalline phases with face-on and edge-on orientation of F8BT chains were identified in the films by grazing-incidence wide angle X-ray scattering technique. A thickness threshold in all investigated aspects of the films at a thickness of about 100 nm was observed that can be attributed to the development of J-H aggregation in the film structure and mutual interplay between these two modes. Although a specific structure-property relationship thickness threshold value may be expected for thin films prepared from various polymers, solvents and under different process conditions, the value of about 100 nm can be generally considered as the characteristic length scale of this phenomenon.Entities:
Keywords: ER-EIS; F8BT; J- and H-aggregates; chain ordering; thin films
Year: 2022 PMID: 35160630 PMCID: PMC8838540 DOI: 10.3390/polym14030641
Source DB: PubMed Journal: Polymers (Basel) ISSN: 2073-4360 Impact factor: 4.329
Figure 1Schematic structure of F8BT polymer.
Figure 2Graph (a) UV-Vis spectra of F8BT with different thicknesses on glass substrates. Graph (b) Difference between the spectra for thin films and the spectrum of the thinnest one. Magenta dot line indicates zero difference for the 10 nm sample itself.
Figure 3Excitation (left), λem = 576 nm and emission (right), λex = 466 nm spectra of F8BT solution and films with different thicknesses.
Figure 4The dependence of peak area ratios of A0–0/(A0–1+A0–2) transitions on the thickness.
Figure 5(a) ER-EIS spectra of F8BT films, (b) the dependences of DOS function on the F8BT film thickness, (c) the dependence of integral of satellite peak on the film thickness, (d) the dependence of transport gap on the film thickness.
Figure 6The representative GIWAXS pattern of a polymer layer with a thickness of 310 nm showing the integration area of the horizontal diffraction peaks along q axis (white rectangle) and the principle of integration of the vertical diffraction peak along q axis between χ = −20° and χ = 20°. The GIWAXS patterns of other thin films are in supplementary file.
Figure 7Dependence of volume phases on the thickness. The numbers above the points indicate the film thickness.