| Literature DB >> 35112814 |
Ana Palčić1, Simona Moldovan2, Hussein El Siblani3, Aurelie Vicente3, Valentin Valtchev3,4.
Abstract
This paper deals with the synthesis conditions-defect formation relationship in zeolites. Silicalite-1 (MFI-type) is used as a model material. Samples synthesized from a system with high basicity (at 100 °C), a system with moderate basicity (at 150 °C), and a fluoride-containing system in neutral medium (at 170 °C) are compared. Well-crystallized materials with sizes ≈0.1, 1-10, and 30-40 µm are obtained. The samples are analyzed by complementary methods providing information on the short- and long-range order in the zeolite framework. A strong correlation between the number of point defects in the zeolite framework and preparation conditions is established. Silicalite-1 synthesized under mild synthesis conditions from a highly basic system exhibits a larger number of framework defects and thus low hydrophobicity. Further, the calcined samples are subjected to aluminum and silicon incorporation by postsynthesis treatment. The Al/Si incorporation in the zeolite framework and its impact on the physicochemical properties is studied by XRD, TEM/SEM, solid-state NMR, FTIR, and thermogravimetric analyses. The defects healing as a function of the number of point defects in the initial material and zeolite crystal size is evaluated. The results of this study will serve for fine-tuning zeolite properties by in situ and postsynthesis methods.Entities:
Keywords: Al/Si incorporation; defect sites; postsynthesis treatment; silanols; zeolites
Year: 2021 PMID: 35112814 PMCID: PMC8811801 DOI: 10.1002/advs.202104414
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 16.806
Figure 1XRD patterns A) of the studied silicalite‐1 materials and their respective SEM images: B) micro‐sil‐1‐F, C) micro‐sil‐1, D) nano‐sil‐1.
XRD, nitrogen physisorption, chemical, TG, NMR, and IR analyses of the studied series of MFI‐type zeolite materials
| Sample |
|
|
|
| Si/AlICP | SiOHext [μmolH g−1] | SiOHint [μmolH g−1] | weight loss [%] |
|
|---|---|---|---|---|---|---|---|---|---|
| nano‐sil‐1 | 1 | 501 | 0.16 | 0.43 | – | 1083 | 2084 | 7.0 (9.6) | 0 |
| nano‐sil‐1‐Al | 1.06 | 518 | 0.16 | 0.41 | 45 | 1901 | 1742 | 7.4 (9.6) | −17 |
| nano‐sil‐1‐Si | 1.09 | 387 | 0.15 | 0.30 | – | 703 | 706 | 1.4 (1.8) | −1947 |
| micro‐sil‐1 | 1 | 371 | 0.17 | 0.01 | – | 140 | 744 | 1.7 (2.6) | 0 |
| micro‐sil‐1‐Al | 1.15 | 385 | 0.17 | 0.03 | 73 | 102 | 575 | 2.7 (4.2) | −157 |
| micro‐sil‐1‐Si | 0.92 | 427 | 0.17 | 0.03 | – | 139 | 546 | 1.2 (1.7) | −202 |
| micro‐sil‐1‐F | 1 | 375 | 0.18 | 0.02 | – | 25 | 0.6 (0.8) | – | |
| nano‐ZSM‐5 | 1 | 516 | 0.17 | 0.38 | 42 | 2478 | 2877 | 8.7 (11.5) | 0 |
| nano‐ZSM‐5‐Al | 1.04 | 448 | 0.14 | 0.37 | 14 | 3169 | 1115 | 11.5 (15.3) | −716 |
| nano‐ZSM‐5‐Si | 1.14 | 350 | 0.15 | 0.20 | 57 | 786 | 2420 | 8.5 (11.1) | −1885 |
f C – relative crystallinity calculated with respect to parent material in each series;
weight loss up to 200 °C and for the whole measurement range (25–800 °C; values in the brackets);
defect structure factor Δz is calculated according to the previously published method using nano‐sil‐1 as a reference material.[ ]
Figure 21H MAS NMR spectra of silicalite‐1 samples prepared from different synthesis mixtures A) dehydrated at 400 °C in vacuum line and B) TGA curves of the silicalite‐1 samples upon hydration in 77% humidity atmosphere.
Figure 3High resolution TEM images of A,B) nano‐sil‐1, C,D) nano‐sil‐1‐Al, and E,F) nano‐sil‐1‐Si.
Figure 4Normalized IR spectra in the hydroxyl groups region of the studied MFI‐type zeolite materials (A) nano‐sil‐1; B) micro‐sil‐1; C) nano‐ZSM‐5).
Figure 5Normalized 1H MAS NMR spectra of studied MFI‐type zeolite materials with the respective deconvolution curves. The value of y‐axis is identical in all spectra.
Figure 6Normalized 27Al MAS NMR spectra of A) aluminated silicalite‐1 samples and B) a series of nanosized ZSM‐5 samples.
Figure 729Si MAS NMR spectra and the respective deconvolution curves of the parent silicalite‐1 samples and the Al‐ and Si‐treated counterparts.